Simpson, R., White, R. G., Watts, J. F., & Baker, M. A. (2017). XPS investigation of monatomic and cluster argon ion sputtering of tantalum pentoxide. Applied surface science, 405, 79-87. https://doi.org/10.1016/j.apsusc.2017.02.006
Chicago Style (17th ed.) CitationSimpson, Robin, Richard G. White, John F. Watts, and Mark A. Baker. "XPS Investigation of Monatomic and Cluster Argon Ion Sputtering of Tantalum Pentoxide." Applied Surface Science 405 (2017): 79-87. https://doi.org/10.1016/j.apsusc.2017.02.006.
MLA (9th ed.) CitationSimpson, Robin, et al. "XPS Investigation of Monatomic and Cluster Argon Ion Sputtering of Tantalum Pentoxide." Applied Surface Science, vol. 405, 2017, pp. 79-87, https://doi.org/10.1016/j.apsusc.2017.02.006.
Warning: These citations may not always be 100% accurate.