Priyatharishini, M., & Nirmala Devi, M. (2022). A deep learning based malicious module identification using stacked sparse autoencoder network for VLSI circuit reliability. Measurement : journal of the International Measurement Confederation, 194, 111055. https://doi.org/10.1016/j.measurement.2022.111055
Chicago-Zitierstil (17. Ausg.)Priyatharishini, M., und M. Nirmala Devi. "A Deep Learning Based Malicious Module Identification Using Stacked Sparse Autoencoder Network for VLSI Circuit Reliability." Measurement : Journal of the International Measurement Confederation 194 (2022): 111055. https://doi.org/10.1016/j.measurement.2022.111055.
MLA-Zitierstil (9. Ausg.)Priyatharishini, M., und M. Nirmala Devi. "A Deep Learning Based Malicious Module Identification Using Stacked Sparse Autoencoder Network for VLSI Circuit Reliability." Measurement : Journal of the International Measurement Confederation, vol. 194, 2022, p. 111055, https://doi.org/10.1016/j.measurement.2022.111055.