Method of moments solution for a printed patch/slot antenna on a thin finite dielectric substrate using the volume Integral equation
In this paper, a volume integral equation (VIE)-based modeling method suitable for a patch or slot antenna on a thin finite dielectric substrate is developed and tested. Two new key features of the method are the use of proper dielectric basis functions and proper VIE conditioning, close to the meta...
Saved in:
| Published in: | IEEE transactions on antennas and propagation Vol. 54; no. 4; pp. 1174 - 1184 |
|---|---|
| Main Authors: | , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
New York, NY
IEEE
01.04.2006
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects: | |
| ISSN: | 0018-926X, 1558-2221 |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Abstract | In this paper, a volume integral equation (VIE)-based modeling method suitable for a patch or slot antenna on a thin finite dielectric substrate is developed and tested. Two new key features of the method are the use of proper dielectric basis functions and proper VIE conditioning, close to the metal surface, where the surface boundary condition of the zero tangential E -component must be extended into adjacent tetrahedra. The extended boundary condition is the exact result for the piecewise-constant dielectric basis functions. The latter operation allows one to achieve a good accuracy with one layer of tetrahedra for a thin dielectric substrate and thereby greatly reduces computational cost. The use of low-order basis functions also implies the use of low-order integration schemes and faster filling of the impedance matrix. For some common patch/slot antennas, the VIE-based modeling approach is found to give an error of about 1% or less in the resonant frequency for one-layer tetrahedral meshes with a relatively small number of unknowns. This error is obtained by comparison with fine finite-element method (FEM) simulations, or with measurements, or with the analytical mode matching approach. Hence it is competitive with both the method of moments surface integral equation approach and with the FEM approach for the printed antennas on thin dielectric substrates. |
|---|---|
| AbstractList | [...] it is competitive with both the method of moments surface integral equation approach and with the FEM approach for the printed antennas on thin dielectric substrates. In this paper, a volume integral equation (VIE)-based modeling method suitable for a patch or slot antenna on a thin finite dielectric substrate is developed and tested. Two new key features of the method are the use of proper dielectric basis functions and proper VIE conditioning, close to the metal surface, where the surface boundary condition of the zero tangential E -component must be extended into adjacent tetrahedra. The extended boundary condition is the exact result for the piecewise-constant dielectric basis functions. The latter operation allows one to achieve a good accuracy with one layer of tetrahedra for a thin dielectric substrate and thereby greatly reduces computational cost. The use of low-order basis functions also implies the use of low-order integration schemes and faster filling of the impedance matrix. For some common patch/slot antennas, the VIE-based modeling approach is found to give an error of about 1 % or less in the resonant frequency for one-layer tetrahedral meshes with a relatively small number of unknowns. This error is obtained by comparison with fine finite-element method (FEM) simulations, or with measurements, or with the analytical mode matching approach. Hence it is competitive with both the method of moments surface integral equation approach and with the FEM approach for the printed antennas on thin dielectric substrates. |
| Author | Makarov, S.N. Kempel, L.C. Marut, A.G. Kulkarni, S.D. |
| Author_xml | – sequence: 1 givenname: S.N. surname: Makarov fullname: Makarov, S.N. organization: Electr. & Comput. Eng. Dept., Worcester Polytech. Inst., MA, USA – sequence: 2 givenname: S.D. surname: Kulkarni fullname: Kulkarni, S.D. organization: Electr. & Comput. Eng. Dept., Worcester Polytech. Inst., MA, USA – sequence: 3 givenname: A.G. surname: Marut fullname: Marut, A.G. organization: Electr. & Comput. Eng. Dept., Worcester Polytech. Inst., MA, USA – sequence: 4 givenname: L.C. surname: Kempel fullname: Kempel, L.C. |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17683420$$DView record in Pascal Francis |
| BookMark | eNqFks9rFDEUx4NUcLt69uAlCOppdpNMMpM5luKPQkUPFbyFTOZNN2Um2SYZwXv_8L51i0JBPT3y5fP9hrx8T8lJiAEIecnZhnPWba_Ovm4EY2qjW6Ea_YSsuFK6EkLwE7JijOuqE833Z-Q05xs8Si3litx9hrKLA40jneMMoWSa47QUHwMdY6KW7pMPBQa6t8XttnmKhVoUQrAUGUvLziPqgy9ABw8TuJK8o3npc0kWxSX7cI0Y0B-YPAO9QPt1shOF28UebnpOno52yvDiYa7Jtw_vr84_VZdfPl6cn11WTnJRqoGPnWp6objrNMM56mHU0ingTLqWy942Tg2sR2Go275pNavdOHRaaGGHtl6Td8fcfYq3C-RiZp8dTJMNEJdstO5k3SlZI_n2n6TQvFYCyf-DTLYK6TV5_Qi8iUsK-FzTccFrIdsD9OYBstnZaUw2OJ8NfsFs00_D20bXUjDk1JFzKeacYDTOl1-rxJX7yXBmDp0w2Alz6IQ5dgJ920e-39F_dbw6OjwA_KEbLnkr63sWkMQt |
| CODEN | IETPAK |
| CitedBy_id | crossref_primary_10_1109_LAWP_2022_3174231 crossref_primary_10_1016_j_physe_2014_09_016 crossref_primary_10_1163_156939311796351597 crossref_primary_10_1109_LAWP_2010_2043710 crossref_primary_10_3390_electronics11233861 crossref_primary_10_1109_TAP_2009_2036191 crossref_primary_10_1002_jnm_2544 crossref_primary_10_1155_2012_181235 crossref_primary_10_1080_02726343_2014_846186 crossref_primary_10_1109_TAP_2024_3524425 crossref_primary_10_3390_electronics11010129 crossref_primary_10_1109_TMTT_2022_3182239 crossref_primary_10_1109_TAP_2010_2046871 crossref_primary_10_1109_TAP_2022_3209247 crossref_primary_10_1109_TAP_2019_2916763 crossref_primary_10_1016_j_physe_2014_09_006 crossref_primary_10_1109_LMWC_2008_918894 crossref_primary_10_1109_LAWP_2022_3183616 crossref_primary_10_1109_TEMC_2013_2245897 crossref_primary_10_1109_TAP_2012_2225820 crossref_primary_10_1109_MAP_2019_2907876 crossref_primary_10_1109_TAP_2013_2281360 crossref_primary_10_1016_j_physe_2014_09_023 crossref_primary_10_1088_1361_6501_aa7faa crossref_primary_10_1007_s11277_021_08887_1 crossref_primary_10_1109_LAWP_2022_3180480 crossref_primary_10_1002_mmce_20442 crossref_primary_10_1049_ell2_70066 crossref_primary_10_1109_LAWP_2008_2003542 crossref_primary_10_1002_mop_31864 |
| Cites_doi | 10.1109/TAP.2004.838803 10.1109/MWSYM.2002.1012235 10.1109/22.60001 10.1109/22.903086 10.1109/LAWP.2004.836580 10.1109/TAP.2005.848518 10.1109/TAP.1984.1143193 10.1109/TAP.2003.809823 10.1109/8.933480 10.1109/8.384200 10.1109/TAP.2004.825645 10.1109/lmwc.2005.845719 10.1109/9780470544303 10.1109/TAP.2004.834377 10.1109/TAP.1982.1142818 10.1109/TAP.2005.844402 10.1002/(SICI)1098-2760(19991005)23:1<42::AID-MOP12>3.0.CO;2-N 10.1109/8.753008 10.1109/22.775434 10.1109/TMTT.2002.1006405 10.1109/TMTT.1983.1131656 10.1109/TAP.2004.825177 10.1109/TAP.2004.834425 10.1109/8.86926 10.1109/APS.2003.1217540 |
| ContentType | Journal Article |
| Copyright | 2006 INIST-CNRS Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006 |
| Copyright_xml | – notice: 2006 INIST-CNRS – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006 |
| DBID | 97E RIA RIE AAYXX CITATION IQODW 7SP 8FD L7M H8D F28 FR3 |
| DOI | 10.1109/TAP.2005.872568 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Xplore CrossRef Pascal-Francis Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace Aerospace Database ANTE: Abstracts in New Technology & Engineering Engineering Research Database |
| DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Aerospace Database Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
| DatabaseTitleList | Technology Research Database Technology Research Database Technology Research Database Engineering Research Database |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Xplore url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Applied Sciences |
| EISSN | 1558-2221 |
| EndPage | 1184 |
| ExternalDocumentID | 2544099571 17683420 10_1109_TAP_2005_872568 1614174 |
| Genre | orig-research |
| GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 85S 97E AAJGR AARMG AASAJ AAWTH ABAZT ABFSI ABQJQ ABVLG ACGFO ACGFS ACIWK ACKIV ACNCT AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 E.L EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RNS RXW TAE TAF TN5 VH1 VJK VOH AAYXX CITATION IQODW RIG 7SP 8FD L7M H8D F28 FR3 |
| ID | FETCH-LOGICAL-c412t-d1f956b251c980b25f8df84c5e104c714ba6c5d0b5e1d37b67803cfd98282ad73 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 44 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000236745300015&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0018-926X |
| IngestDate | Wed Oct 01 09:19:20 EDT 2025 Sun Sep 28 00:14:08 EDT 2025 Sun Nov 09 14:06:02 EST 2025 Sun Nov 30 03:54:18 EST 2025 Mon Jul 21 09:15:55 EDT 2025 Tue Nov 18 21:59:14 EST 2025 Sat Nov 29 08:05:15 EST 2025 Tue Aug 26 16:36:53 EDT 2025 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 4 |
| Keywords | Cost minimization Boundary condition Modeling Convergence Finite element method Accuracy Dielectric substrate Slot antenna Resonance frequency Integral equation Permittivity Surface conditions patch antennas low order basis functions volume integral equation (VIE) Moment method Piecewise constant techniques Printed antenna Tetrahedral shape method of moments (MoM) Computational complexity Mode matching method Dielectric function Simulation Analytical method Open market Impedance matrix |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html CC BY 4.0 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c412t-d1f956b251c980b25f8df84c5e104c714ba6c5d0b5e1d37b67803cfd98282ad73 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 ObjectType-Article-2 ObjectType-Feature-1 content type line 23 |
| PQID | 912132471 |
| PQPubID | 23500 |
| PageCount | 11 |
| ParticipantIDs | pascalfrancis_primary_17683420 ieee_primary_1614174 proquest_miscellaneous_28047581 proquest_miscellaneous_889439543 proquest_journals_912132471 crossref_citationtrail_10_1109_TAP_2005_872568 crossref_primary_10_1109_TAP_2005_872568 proquest_miscellaneous_28135254 |
| PublicationCentury | 2000 |
| PublicationDate | 2006-04-01 |
| PublicationDateYYYYMMDD | 2006-04-01 |
| PublicationDate_xml | – month: 04 year: 2006 text: 2006-04-01 day: 01 |
| PublicationDecade | 2000 |
| PublicationPlace | New York, NY |
| PublicationPlace_xml | – name: New York, NY – name: New York |
| PublicationTitle | IEEE transactions on antennas and propagation |
| PublicationTitleAbbrev | TAP |
| PublicationYear | 2006 |
| Publisher | IEEE Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| References | ref13 ref12 ref15 ref14 ref11 ref10 ref2 ref1 Unterberger (ref27) ref17 ref16 ref18 ref24 ref23 ref25 ref22 ref21 ref28 Kulkarni (ref19) 2004 Apte (ref20) 2003 Bancroft (ref26) 2004 ref29 ref8 ref7 ref9 ref4 ref3 ref6 ref5 |
| References_xml | – ident: ref11 doi: 10.1109/TAP.2004.838803 – ident: ref8 doi: 10.1109/MWSYM.2002.1012235 – ident: ref12 doi: 10.1109/22.60001 – ident: ref4 doi: 10.1109/22.903086 – ident: ref23 doi: 10.1109/LAWP.2004.836580 – ident: ref24 doi: 10.1109/TAP.2005.848518 – ident: ref7 doi: 10.1109/TAP.1984.1143193 – ident: ref10 doi: 10.1109/TAP.2003.809823 – ident: ref21 doi: 10.1109/8.933480 – ident: ref18 doi: 10.1109/8.384200 – ident: ref3 doi: 10.1109/TAP.2004.825645 – ident: ref29 doi: 10.1109/lmwc.2005.845719 – ident: ref16 doi: 10.1109/9780470544303 – ident: ref15 doi: 10.1109/TAP.2004.834377 – ident: ref17 doi: 10.1109/TAP.1982.1142818 – ident: ref13 doi: 10.1109/TAP.2005.844402 – ident: ref14 doi: 10.1002/(SICI)1098-2760(19991005)23:1<42::AID-MOP12>3.0.CO;2-N – ident: ref28 doi: 10.1109/8.753008 – ident: ref6 doi: 10.1109/22.775434 – ident: ref5 doi: 10.1109/TMTT.2002.1006405 – ident: ref1 doi: 10.1109/TMTT.1983.1131656 – start-page: 118 volume-title: Simulation of patch antennas on arbitrary dielectric substrates year: 2003 ident: ref20 – start-page: 155 volume-title: MoM modeling of metal-dielectric structures using volume integral equations year: 2004 ident: ref19 – ident: ref22 doi: 10.1109/TAP.2004.825177 – ident: ref25 doi: 10.1109/TAP.2004.834425 – ident: ref2 doi: 10.1109/8.86926 – ident: ref9 doi: 10.1109/APS.2003.1217540 – volume-title: Microstrip and Printed Antenna Design year: 2004 ident: ref26 – volume-title: An Introduction to HFSS Optimetrics™, Ansoft HFSS/Ensemble Users’ Workshop ident: ref27 |
| SSID | ssj0014844 |
| Score | 2.0674248 |
| Snippet | In this paper, a volume integral equation (VIE)-based modeling method suitable for a patch or slot antenna on a thin finite dielectric substrate is developed... [...] it is competitive with both the method of moments surface integral equation approach and with the FEM approach for the printed antennas on thin... |
| SourceID | proquest pascalfrancis crossref ieee |
| SourceType | Aggregation Database Index Database Enrichment Source Publisher |
| StartPage | 1174 |
| SubjectTerms | Antennas Applied sciences Basis functions Boundary conditions Computational efficiency Computer simulation Convergence Dielectric substrates Dielectrics Exact sciences and technology Filling Finite element method Impedance Integral equations low order basis functions Mathematical analysis Mathematical models method of moments (MoM) Moment methods Patch antennas Radiocommunications Resonant frequency Slot antennas Studies Telecommunications Telecommunications and information theory Testing volume integral equation (VIE) |
| Title | Method of moments solution for a printed patch/slot antenna on a thin finite dielectric substrate using the volume Integral equation |
| URI | https://ieeexplore.ieee.org/document/1614174 https://www.proquest.com/docview/912132471 https://www.proquest.com/docview/28047581 https://www.proquest.com/docview/28135254 https://www.proquest.com/docview/889439543 |
| Volume | 54 |
| WOSCitedRecordID | wos000236745300015&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE Xplore customDbUrl: eissn: 1558-2221 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014844 issn: 0018-926X databaseCode: RIE dateStart: 19630101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Lb9QwEB61FQc48CqIUChz4MCBdJ3YSexjhahAgqqHIu0tcmyHRlqS0mT5BfxwxnZ2SwVF4pQonkiWx_P0-BuA16IReSN1kbal5qlwuU11JU3aaFuRx6wdj5D5n6rTU7lcqrMdeLu9C-OcC8Vn7si_hrN8O5i1T5UtyDsR5EHvwm5VlfGu1vbEQEgREZczEuC8XM4wPhlTi_Pjs5g8kRUZeHnDAoWWKr4gUo-0Jm1sZvGHXg7G5uTB_03zIdyfnUo8jrvgEey4_jHc-w1qcB9-fg6tonFo8dsQrrXhZtch-a2o0Wf4yP3ES1LOF4txNUzoV73vNRKNxumiI9LO-6hou9g-pzM4kuYJCLfoS-i_EpnDqPLwY4SiWKH7HgHFn8CXk_fn7z6kcweG1Igsn1KbtRQ_NeQDGSUZPVtpWylM4SiKM1UmGl2awrKGPlheNWT5GDetVRTH5cRt_hT2-qF3zwCNtTrj1pWcO1Eo1XDLS1syKxzLnXUJHG24UpsZntx3yVjVIUxhqiY2-qaZRR3ZmMCb7Q-XEZnjdtJ9z6VrssigBA5vsP16nGIwLnKWwMFmH9SzaI-18iB4Odn0BF5tR0km_UGL7t2wHutcMkFx2D8pMo9DS1PAWyikB8ZXheDP_z75A7gbs0G-iOgF7E1Xa_cS7pgfUzdeHQbZ-AUOChBM |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Lb9QwEB6VggQceBXUUGjnwIED6SaxkzjHClG1YrvqYZH2Fjm200ZakrbJ8gv44Yzt7JYKisQpUTyRLI_n6fE3AB94xZNKyDSsM8lCbhIdylyosJI6J49ZGuYh86f5bCYWi-J8Cz5t7sIYY1zxmTm0r-4sX3dqZVNlE_JOOHnQD-Ch7Zw13tbanBlwwT3mckwinGSLEcgnjorJ_Ojcp09ETiZe3LFBrqmKLYmUPa1K7dtZ_KGZnbk5fv5_E30Bz0a3Eo_8PngJW6Z9BU9_AxvcgZ9nrlk0djV-79zFNlzvOyTPFSXaHB85oHhF6vly0i-7Ae26t61EopE4XDZE2lgvFXXjG-g0CnvSPQ7jFm0R_QWRGfRKD089GMUSzbWHFH8N346_zD-fhGMPhlDxOBlCHdcUQVXkBalCRPSsha4FV6mhOE7lMa9kplIdVfRBs7wi2xcxVeuCIrmE-M3ewHbbtWYXUGktY6ZNxpjhaVFUTLNMZ5HmJkqMNgEcrrlSqhGg3PbJWJYuUImKktho22ampWdjAB83P1x5bI77SXcsl27JPIMC2L_D9ttxisIYT6IA9tb7oByFuy8LC4OXkFUP4GAzSlJpj1pka7pVXyYi4hSJ_ZMitki0NAW8h0JYaPwi5ezt3yd_AI9P5mfTcno6-7oHT3xuyJYUvYPt4WZl3sMj9WNo-pt9Jye_AFQtE5U |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Method+of+moments+solution+for+a+printed+patch%2Fslot+antenna+on+a+thin+finite+dielectric+substrate+using+the+volume+Integral+equation&rft.jtitle=IEEE+transactions+on+antennas+and+propagation&rft.au=Makarov%2C+S+N&rft.au=Kulkarni%2C+S+D&rft.au=Marut%2C+A+G&rft.au=Kempel%2C+L+C&rft.date=2006-04-01&rft.issn=0018-926X&rft.volume=54&rft.issue=4&rft.spage=1174&rft.epage=1184&rft_id=info:doi/10.1109%2FTAP.2005.872568&rft.externalDBID=NO_FULL_TEXT |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-926X&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-926X&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-926X&client=summon |