A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images

In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes topical subject in industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in practice, where deep learning-based algorithms perform better than t...

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Bibliographic Details
Published in:IEEE access Vol. 11; p. 1
Main Authors: Cui, Yajie, Liu, Zhaoxiang, Lian, Shiguo
Format: Journal Article
Language:English
Published: Piscataway IEEE 01.01.2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:2169-3536, 2169-3536
Online Access:Get full text
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