An Enhanced Reduced Basis Method for Wideband Finite Element Method Simulations

In this paper, we present a novel strategy for selecting expansion points in the reduced basis method. A single computation of the error estimator is used to select a few expansion points in the multi-parameter space simultaneously. The number of selected points is determined adaptively, based on th...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:IEEE access Ročník 7; s. 60877 - 60884
Hlavní autoři: Szypulski, Damian, Fotyga, Grzegorz, Mrozowski, Michal
Médium: Journal Article
Jazyk:angličtina
Vydáno: Piscataway IEEE 2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:
ISSN:2169-3536, 2169-3536
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Abstract In this paper, we present a novel strategy for selecting expansion points in the reduced basis method. A single computation of the error estimator is used to select a few expansion points in the multi-parameter space simultaneously. The number of selected points is determined adaptively, based on the accuracy of the current reduced model. The reliability and efficiency of this proposed approach are illustrated by numerical tests considering real-life structures, including dielectric resonator filter, H-plane filter, and four-pole dielectric-loaded cavity filter.
AbstractList In this paper, we present a novel strategy for selecting expansion points in the reduced basis method. A single computation of the error estimator is used to select a few expansion points in the multi-parameter space simultaneously. The number of selected points is determined adaptively, based on the accuracy of the current reduced model. The reliability and efficiency of this proposed approach are illustrated by numerical tests considering real-life structures, including dielectric resonator filter, H-plane filter, and four-pole dielectric-loaded cavity filter.
Author Szypulski, Damian
Fotyga, Grzegorz
Mrozowski, Michal
Author_xml – sequence: 1
  givenname: Damian
  orcidid: 0000-0003-4121-8113
  surname: Szypulski
  fullname: Szypulski, Damian
  email: damian.szypulski@pg.edu.pl
  organization: Faculty of Electronics, Telecommunications, and Informatics, Gdańsk University of Technology, Gdańsk, Poland
– sequence: 2
  givenname: Grzegorz
  orcidid: 0000-0001-5268-6858
  surname: Fotyga
  fullname: Fotyga, Grzegorz
  organization: Faculty of Electronics, Telecommunications, and Informatics, Gdańsk University of Technology, Gdańsk, Poland
– sequence: 3
  givenname: Michal
  orcidid: 0000-0002-1110-8717
  surname: Mrozowski
  fullname: Mrozowski, Michal
  organization: Faculty of Electronics, Telecommunications, and Informatics, Gdańsk University of Technology, Gdańsk, Poland
BookMark eNqFUU1rGzEQFSWFpml-QS4LPdvVx0q7OrrGaQMpgbohRzErjRqZtZRK8iH_vutsGkoumcsMw3tvhvc-kpOYIhJyweiSMaq_rNbrzXa75JTpJddMStm9I6ecKb0QUqiT_-YP5LyUHZ2qn1ayOyU3q9hs4j1Ei675ie5w7F-hhNL8wHqfXONTbu6CwwGiay5DDBWbzYh7jPUfZBv2hxFqSLF8Iu89jAXPn_sZub3c_Fp_X1zffLtar64XtqV9XbjBIXKpvFYauOt57zwCCE7BejtY3XYWrZTcC-x7rqR0oAcnALX0wKk4I1ezrkuwMw857CE_mgTBPC1S_m0g12BHND3TDGTnJDjVqtbrjonBcqcos17Jo9bnWeshpz8HLNXs0iHH6X3DWykVnZzqJpSYUTanUjL6l6uMmmMQZg7CHIMwz0FMLP2KZUN9sqpmCOMb3IuZGxDx5Vrf0ck0If4CmD2X5A
CODEN IAECCG
CitedBy_id crossref_primary_10_1109_TAP_2020_2970027
crossref_primary_10_1109_ACCESS_2019_2935541
crossref_primary_10_1109_ACCESS_2021_3068937
crossref_primary_10_1109_TAP_2021_3060908
Cites_doi 10.1109/TMTT.2004.831583
10.1051/m2an:2007031
10.1109/TMTT.2009.2034208
10.1080/02726343.2014.877735
10.1109/43.370425
10.1109/TMTT.2016.2560167
10.1109/TADVP.2008.2010249
10.1109/TMTT.2013.2258167
10.1109/LMWC.2015.2451370
10.1109/20.996166
10.1109/LMWC.2015.2400937
10.1109/TMTT.2010.2078370
10.1109/TMAG.2014.2353138
10.1108/COMPEL-04-2013-0119
10.1109/LMWC.2014.2328892
10.1109/22.339797
10.1109/TMTT.2003.820892
10.1109/22.575605
10.1109/LAWP.2018.2817391
10.1108/03321641111168156
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
DBID 97E
ESBDL
RIA
RIE
AAYXX
CITATION
7SC
7SP
7SR
8BQ
8FD
JG9
JQ2
L7M
L~C
L~D
DOA
DOI 10.1109/ACCESS.2019.2915557
DatabaseName IEEE Xplore (IEEE)
IEEE Xplore Open Access Journals
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Engineered Materials Abstracts
METADEX
Technology Research Database
Materials Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DOAJ Directory of Open Access Journals
DatabaseTitle CrossRef
Materials Research Database
Engineered Materials Abstracts
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
METADEX
Computer and Information Systems Abstracts Professional
DatabaseTitleList Materials Research Database


Database_xml – sequence: 1
  dbid: DOA
  name: DOAJ Directory of Open Access Journals
  url: https://www.doaj.org/
  sourceTypes: Open Website
– sequence: 2
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 2169-3536
EndPage 60884
ExternalDocumentID oai_doaj_org_article_8191a57d5ad6464f9713bc2d601cf650
10_1109_ACCESS_2019_2915557
8709693
Genre orig-research
GrantInformation_xml – fundername: Foundation for Polish Science through the TEAM-TECH Programme
– fundername: Fundacja na rzecz Nauki Polskiej
  grantid: POIR.04.04.00-00-1DC3/16-00 date 06.12.2016 r
  funderid: 10.13039/501100001870
– fundername: European Regional Development Fund
  funderid: 10.13039/501100008530
– fundername: Smart Growth Operational Programme
  grantid: 2014-2020
GroupedDBID 0R~
4.4
5VS
6IK
97E
AAJGR
ABAZT
ABVLG
ACGFS
ADBBV
AGSQL
ALMA_UNASSIGNED_HOLDINGS
BCNDV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
EBS
EJD
ESBDL
GROUPED_DOAJ
IPLJI
JAVBF
KQ8
M43
M~E
O9-
OCL
OK1
RIA
RIE
RNS
AAYXX
CITATION
7SC
7SP
7SR
8BQ
8FD
JG9
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c408t-dbdee256f969a2d828dfeaa320acfcbc947cec552f3e882655da9bd3ae95fa203
IEDL.DBID DOA
ISICitedReferencesCount 4
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000469363800001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 2169-3536
IngestDate Fri Oct 03 12:51:44 EDT 2025
Sun Nov 30 04:46:51 EST 2025
Tue Nov 18 22:52:10 EST 2025
Sat Nov 29 03:57:34 EST 2025
Wed Aug 27 05:51:10 EDT 2025
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/OAPA.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c408t-dbdee256f969a2d828dfeaa320acfcbc947cec552f3e882655da9bd3ae95fa203
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0001-5268-6858
0000-0002-1110-8717
0000-0003-4121-8113
OpenAccessLink https://doaj.org/article/8191a57d5ad6464f9713bc2d601cf650
PQID 2455609577
PQPubID 4845423
PageCount 8
ParticipantIDs doaj_primary_oai_doaj_org_article_8191a57d5ad6464f9713bc2d601cf650
crossref_citationtrail_10_1109_ACCESS_2019_2915557
ieee_primary_8709693
proquest_journals_2455609577
crossref_primary_10_1109_ACCESS_2019_2915557
PublicationCentury 2000
PublicationDate 20190000
2019-00-00
20190101
2019-01-01
PublicationDateYYYYMMDD 2019-01-01
PublicationDate_xml – year: 2019
  text: 20190000
PublicationDecade 2010
PublicationPlace Piscataway
PublicationPlace_xml – name: Piscataway
PublicationTitle IEEE access
PublicationTitleAbbrev Access
PublicationYear 2019
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref12
ref15
ref14
lamecki (ref20) 2014; 23
ref11
ref22
ref10
ref2
ref1
ref17
ref16
ref19
ref18
ref8
ref7
ref9
ruiz-cruz (ref21) 2010
ref4
ref3
ref6
ref5
References_xml – ident: ref22
  doi: 10.1109/TMTT.2004.831583
– ident: ref16
  doi: 10.1051/m2an:2007031
– ident: ref7
  doi: 10.1109/TMTT.2009.2034208
– ident: ref10
  doi: 10.1080/02726343.2014.877735
– ident: ref2
  doi: 10.1109/43.370425
– ident: ref5
  doi: 10.1109/TMTT.2016.2560167
– ident: ref13
  doi: 10.1109/TADVP.2008.2010249
– volume: 23
  start-page: 970
  year: 2014
  ident: ref20
  article-title: An efficient framework for fast computer aided design of microwave circuits based on the higher-order 3D finite-element method
  publication-title: Radioengineering
– ident: ref11
  doi: 10.1109/TMTT.2013.2258167
– ident: ref14
  doi: 10.1109/LMWC.2015.2451370
– ident: ref4
  doi: 10.1109/20.996166
– ident: ref8
  doi: 10.1109/LMWC.2015.2400937
– ident: ref3
  doi: 10.1109/TMTT.2010.2078370
– ident: ref12
  doi: 10.1109/TMAG.2014.2353138
– ident: ref15
  doi: 10.1108/COMPEL-04-2013-0119
– ident: ref18
  doi: 10.1109/LMWC.2014.2328892
– ident: ref1
  doi: 10.1109/22.339797
– year: 2010
  ident: ref21
  article-title: Computer aided design of waveguide devices by mode-matching methods
  publication-title: Passive Microwave Components and Antennas
– ident: ref17
  doi: 10.1109/TMTT.2003.820892
– ident: ref19
  doi: 10.1109/22.575605
– ident: ref6
  doi: 10.1109/LAWP.2018.2817391
– ident: ref9
  doi: 10.1108/03321641111168156
SSID ssj0000816957
Score 2.1442504
Snippet In this paper, we present a novel strategy for selecting expansion points in the reduced basis method. A single computation of the error estimator is used to...
SourceID doaj
proquest
crossref
ieee
SourceType Open Website
Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 60877
SubjectTerms a posteriori error estimator
Broadband
Cavity resonators
Computational modeling
Finite element analysis
Finite element method
Frequency estimation
Model accuracy
Model-order reduction
Read only memory
Reliability
Scattering parameters
SummonAdditionalLinks – databaseName: IEEE Electronic Library (IEL)
  dbid: RIE
  link: http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3Pa9swFH60oYfusLVLy7KlQ4cd49SxJSs6JiGhh64t-9mbkPWDGjZnxMn-_unJigmsDHayMZKR_El-35OevgfwgQc7nboEjX1CDS8SJaY68dxdUCecSkNszrdbfnc3fXwUD0cw6s7CWGtD8Jkd423YyzdrvcOlsms_tkQh8mM45rxoz2p16ymYQEIwHoWFJqm4ni0Wvg8YvSXGGcqgowk6MD5Boz8mVfnrTxzMy-rV_zXsDF5GGklmLe7ncGTr1_DiQFywD_ezmizrp7DDTz6hQqu_zlVTNeRjSBtNPF8l3ytjS1UbsqqQfZJlG06-L_K5-hnzezUX8HW1_LK4SWL6hETTdLpNTGms9YzG-aapzHjXyjirlEdGaadLLSjXVjOWudx6nl0wZpQoTa6sYE5laX4JvXpd2zdAeMGoc1OqhXJUm4nKHdN5npUTbqwRkwFk--8qddQWxxQXP2TwMVIhWzAkgiEjGAMYdZV-tdIa_y4-R8C6oqiLHR54JGScZhLdT8W4YcoUtPCDzfvgpc6Mdzu182R0AH1Er3tJBG4Awz38Ms7hRmaUMZTj4_zt87XewSk2sF2QGUJvu9nZKzjRv7dVs3kfhucf53riWw
  priority: 102
  providerName: IEEE
Title An Enhanced Reduced Basis Method for Wideband Finite Element Method Simulations
URI https://ieeexplore.ieee.org/document/8709693
https://www.proquest.com/docview/2455609577
https://doaj.org/article/8191a57d5ad6464f9713bc2d601cf650
Volume 7
WOSCitedRecordID wos000469363800001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVAON
  databaseName: DOAJ Directory of Open Access Journals
  customDbUrl:
  eissn: 2169-3536
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0000816957
  issn: 2169-3536
  databaseCode: DOA
  dateStart: 20130101
  isFulltext: true
  titleUrlDefault: https://www.doaj.org/
  providerName: Directory of Open Access Journals
– providerCode: PRVHPJ
  databaseName: ROAD: Directory of Open Access Scholarly Resources
  customDbUrl:
  eissn: 2169-3536
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0000816957
  issn: 2169-3536
  databaseCode: M~E
  dateStart: 20130101
  isFulltext: true
  titleUrlDefault: https://road.issn.org
  providerName: ISSN International Centre
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV07T8MwELZQxQADAgqiUCoPjITmYcfx2FatGGhBPLtZjh8iEgTUFEZ-O7bjVpGQYGFJpMhO4s8X333J5TsAzojz06EOrLMPkCRpwGkmAhO7U6Sp5qHLzXm8IrNZNp_Tm0apL5sTVssD18D1LaHgmEjMZYpS092wqlzE0hAJodOarYeENsiUW4OzKKWYeJmhKKT9wWhkRmRzuehFbEXRrUNquCKn2O9LrPxYl52zmeyCHR8lwkF9d3tgQ5X7YLuhHdgG14MSjstn9wEf3loBVrMf8qqo4NRVhYYmHIVPhVQ5LyWcFDa4hOM6W3zV5K549eW7qgPwMBnfjy4DXx0hECjMloHMpVImYNE0pTyWhjlJrTg3wHOhRS4oIkIJjGOdKBNGpxhLTnOZcEWx5nGYHIJW-VaqIwBJipHWGRKUayRkxBONRZLEeUSkkjTqgHgFFBNeOtxWsHhhjkKElNXoMosu8-h2wPm603utnPF786GdgXVTK3vtDhhjYN4Y2F_G0AFtO3_rk5jFyKCTdEB3NZ_MP6IVixHGVm2PkOP_uPQJ2LLDqd_OdEFrufhQp2BTfC6LatFz1mm2069xz_1j-A11i-az
linkProvider Directory of Open Access Journals
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3Pb9MwFH4aGxJw2AYbojDAB47Lljp2XB-7qtUQXTeNAbtZjn-ISJCipdvfPz_HjSYNIXFKFNmRnc_O-579_D2ATyLa6dxnaOwzZkWZaTkyWeDuknnpdR5jc77PxWIxur6WFxtw2J-Fcc7F4DN3hLdxL98uzS0ulR2HsSVLWTyBLc4YzbvTWv2KCqaQkFwkaaFhLo_Hk0noBcZvySOKQuhohB6Yn6jSn9KqPPoXRwMz2_m_pu3CdiKSZNwh_xI2XPMKXjyQF9yD83FDps3PuMdPLlGjNVxPdFu35CwmjiaBsZIftXWVbiyZ1cg_ybQLKF8X-Vr_Thm-2n34NpteTU6zlEAhMywfrTJbWecCp_GhaZra4FxZ77QO2GjjTWUkE8YZzqkvXGDaJedWy8oW2knuNc2L17DZLBv3BogoOfN-xIzUnhk71IXnpihoNRTWWTkcAF1_V2WSujgmufilopeRS9WBoRAMlcAYwGFf6U8nrvHv4icIWF8UlbHjg4CEShNNoQOqubBc25KVYbgFL7wy1AbH0_hARwewh-j1L0nADeBgDb9Ks7hVlHGOgnxCvP17rY_w7PTqbK7mnxdf3sFzbGy3PHMAm6ubW_cenpq7Vd3efIhD9R7QreWi
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=An+Enhanced+Reduced+Basis+Method+for+Wideband+Finite+Element+Method+Simulations&rft.jtitle=IEEE+access&rft.au=Szypulski%2C+Damian&rft.au=Fotyga%2C+Grzegorz&rft.au=Mrozowski%2C+Michal&rft.date=2019&rft.issn=2169-3536&rft.eissn=2169-3536&rft.volume=7&rft.spage=60877&rft.epage=60884&rft_id=info:doi/10.1109%2FACCESS.2019.2915557&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_ACCESS_2019_2915557
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2169-3536&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2169-3536&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2169-3536&client=summon