Akbar, C., Li, Y., & Sung, W. (2021). Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs. IEEE access, 9, 73467-73481. https://doi.org/10.1109/ACCESS.2021.3079981
Chicago-Zitierstil (17. Ausg.)Akbar, Chandni, Yiming Li, und Wen-Li Sung. "Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs." IEEE Access 9 (2021): 73467-73481. https://doi.org/10.1109/ACCESS.2021.3079981.
MLA-Zitierstil (9. Ausg.)Akbar, Chandni, et al. "Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs." IEEE Access, vol. 9, 2021, pp. 73467-73481, https://doi.org/10.1109/ACCESS.2021.3079981.