APA (7th ed.) Citation

Li, J., Zhao, K., Ma, J., & Zhang, T. (2015). True-Damage-Aware Enumerative Coding for Improving nand Flash Memory Endurance. IEEE transactions on very large scale integration (VLSI) systems, 23(6), 1165-1169. https://doi.org/10.1109/TVLSI.2014.2332099

Chicago Style (17th ed.) Citation

Li, Jiangpeng, Kai Zhao, Jun Ma, and Tong Zhang. "True-Damage-Aware Enumerative Coding for Improving Nand Flash Memory Endurance." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23, no. 6 (2015): 1165-1169. https://doi.org/10.1109/TVLSI.2014.2332099.

MLA (9th ed.) Citation

Li, Jiangpeng, et al. "True-Damage-Aware Enumerative Coding for Improving Nand Flash Memory Endurance." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 23, no. 6, 2015, pp. 1165-1169, https://doi.org/10.1109/TVLSI.2014.2332099.