Hao, S., Yang, J., & Berenguer, C. (2019). Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors. Reliability engineering & system safety, 189(September), 261-270. https://doi.org/10.1016/j.ress.2019.04.031
Chicago-Zitierstil (17. Ausg.)Hao, Songhua, Jun Yang, und Christophe Berenguer. "Degradation Analysis Based on an Extended Inverse Gaussian Process Model with Skew-normal Random Effects and Measurement Errors." Reliability Engineering & System Safety 189, no. September (2019): 261-270. https://doi.org/10.1016/j.ress.2019.04.031.
MLA-Zitierstil (9. Ausg.)Hao, Songhua, et al. "Degradation Analysis Based on an Extended Inverse Gaussian Process Model with Skew-normal Random Effects and Measurement Errors." Reliability Engineering & System Safety, vol. 189, no. September, 2019, pp. 261-270, https://doi.org/10.1016/j.ress.2019.04.031.