Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography
Interfaces play critical roles in materials and are usually both structurally and compositionally complex microstructural features. The precise characterization of their nature in three-dimensions at the atomic scale is one of the grand challenges for microscopy and microanalysis, as this informatio...
Saved in:
| Published in: | Microscopy and microanalysis Vol. 26; no. 2; pp. 247 - 257 |
|---|---|
| Main Authors: | , , , , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
United States
Oxford University Press
01.04.2020
Cambridge University Press |
| Subjects: | |
| ISSN: | 1431-9276, 1435-8115, 1435-8115 |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Be the first to leave a comment!