Jenkins, B. M., Danoix, F., Gouné, M., Bagot, P. A., Peng, Z., Moody, M. P., & Gault, B. (2020). Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography. Microscopy and microanalysis, 26(2), 247-257. https://doi.org/10.1017/S1431927620000197
Citácia podle Chicago (17th ed.)Jenkins, Benjamin M., Frédéric Danoix, Mohamed Gouné, Paul A.J Bagot, Zirong Peng, Michael P. Moody, a Baptiste Gault. "Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography." Microscopy and Microanalysis 26, no. 2 (2020): 247-257. https://doi.org/10.1017/S1431927620000197.
Citácia podľa MLA (8th ed.)Jenkins, Benjamin M., et al. "Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography." Microscopy and Microanalysis, vol. 26, no. 2, 2020, pp. 247-257, https://doi.org/10.1017/S1431927620000197.