APA (7th ed.) Citation

Martorell, S., Carlos, S., Sánchez, A., & Serradell, V. (2000). Constrained optimization of test intervals using a steady-state genetic algorithm. Reliability engineering & system safety, 67(3), 215-232. https://doi.org/10.1016/S0951-8320(99)00074-5

Chicago Style (17th ed.) Citation

Martorell, S., S. Carlos, A. Sánchez, and V. Serradell. "Constrained Optimization of Test Intervals Using a Steady-state Genetic Algorithm." Reliability Engineering & System Safety 67, no. 3 (2000): 215-232. https://doi.org/10.1016/S0951-8320(99)00074-5.

MLA (9th ed.) Citation

Martorell, S., et al. "Constrained Optimization of Test Intervals Using a Steady-state Genetic Algorithm." Reliability Engineering & System Safety, vol. 67, no. 3, 2000, pp. 215-232, https://doi.org/10.1016/S0951-8320(99)00074-5.