Absorption phenomena in organic thin films for solar cell applications investigated by photothermal deflection spectroscopy
A high sensitive approach is presented to detect in particular the low level absorption features in pure and blended organic semiconductor films, revealing a.o. defect induced sub gap absorption and new interactions between the materials. Because sub bandgap absorption features are typically charact...
Uloženo v:
| Vydáno v: | Journal of materials science Ročník 40; číslo 6; s. 1413 - 1418 |
|---|---|
| Hlavní autoři: | , , , , , , , , |
| Médium: | Journal Article |
| Jazyk: | angličtina |
| Vydáno: |
New York
Springer Nature B.V
01.03.2005
|
| Témata: | |
| ISSN: | 0022-2461, 1573-4803 |
| On-line přístup: | Získat plný text |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
|
| Abstract | A high sensitive approach is presented to detect in particular the low level absorption features in pure and blended organic semiconductor films, revealing a.o. defect induced sub gap absorption and new interactions between the materials. Because sub bandgap absorption features are typically characterized by very low absorption coefficients, it is not possible to resolve them using common transmission and reflection measurements. Therefore the very sensitive and ground state spectroscopic technique of Photothermal Deflection Spectroscopy (PDS) has been developed, and introduced to characterize thin films of MDMO-PPV and PCBM, as well as films of MDMO-PPV containing an increasing amount of PCBM ranging from 5 to 90% weight fraction. The measured spectra of MDMO-PPV are interpreted in terms of defect induced absorption phenomena. The spectral position of the observed transitions in PCBM have been determined and verified. The PDS-study on MDMO-PPV/PCBM blended films revealed for the first time interaction between the two materials in the ground state. To get more insight in the interaction mechanism between the constituting materials a systematic Transmission Electron Microscopy (TEM) study has been carried out to reveal the morphology of the films. The obtained TEM-results on nanomorphology of the blended films show clear correlations with the PDS-results. |
|---|---|
| AbstractList | A high sensitive approach is presented to detect in particular the low level absorption features in pure and blended organic semiconductor films, revealing a.o. defect induced sub gap absorption and new interactions between the materials. Because sub bandgap absorption features are typically characterized by very low absorption coefficients, it is not possible to resolve them using common transmission and reflection measurements. Therefore the very sensitive and ground state spectroscopic technique of Photothermal Deflection Spectroscopy (PDS) has been developed, and introduced to characterize thin films of MDMO-PPV and PCBM, as well as films of MDMO-PPV containing an increasing amount of PCBM ranging from 5 to 90% weight fraction. The measured spectra of MDMO-PPV are interpreted in terms of defect induced absorption phenomena. The spectral position of the observed transitions in PCBM have been determined and verified. The PDS-study on MDMO-PPV/PCBM blended films revealed for the first time interaction between the two materials in the ground state. To get more insight in the interaction mechanism between the constituting materials a systematic Transmission Electron Microscopy (TEM) study has been carried out to reveal the morphology of the films. The obtained TEM-results on nanomorphology of the blended films show clear correlations with the PDS-results. |
| Author | Lutsen, L. Goris, L. Haenen, K. De Schepper, L. Manca, J. V. Vanderzande, D. D’haen, J. Nesládek, M. Wagner, P. |
| Author_xml | – sequence: 1 givenname: L. surname: Goris fullname: Goris, L. – sequence: 2 givenname: K. surname: Haenen fullname: Haenen, K. – sequence: 3 givenname: M. surname: Nesládek fullname: Nesládek, M. – sequence: 4 givenname: P. surname: Wagner fullname: Wagner, P. – sequence: 5 givenname: D. surname: Vanderzande fullname: Vanderzande, D. – sequence: 6 givenname: L. surname: De Schepper fullname: De Schepper, L. – sequence: 7 givenname: J. surname: D’haen fullname: D’haen, J. – sequence: 8 givenname: L. surname: Lutsen fullname: Lutsen, L. – sequence: 9 givenname: J. V. surname: Manca fullname: Manca, J. V. |
| BookMark | eNp9kUtr3DAUhUVJoZM0PyA7QaF04_TqbS9D6AsC2TRrIctSRkGWXMlTGPrnI2e6yiIrSfCdo3vuOUdnKSeH0BWBawKgvlYCvWAdgOhAKNnBO7QjQrGO98DO0A6A0o5yST6g81qfoIGKkh36dzPWXJY15ISXvUt5dsngkHAujyYFi9d9e_gQ54p9LrjmaAq2LkZsliUGazZpbYq_rq7h0axuwuOxeeU1r3tXZhPx5Hx09uWPurRLydXm5fgRvfcmVnf5_7xAD9-__b792d3d__h1e3PXWQ5s7fqh96P3RDo_9qIXhpAJpBLMCMv7URJhFafSOWXAwjDxkTMysIlICV6qiV2gzyffpeQ_hzamnkPdIpjk8qFq2vMBBk4a-OVNsO2YEkUGtaGfXqFP-VBSi6EpFYOCgXHeKHKibItci_N6KWE25dis9NabPvWmWx16601D06hXGhvWly2vxYT4hvIZPUWgXQ |
| CitedBy_id | crossref_primary_10_1016_j_jnoncrysol_2005_09_053 crossref_primary_10_1021_ja1045742 crossref_primary_10_1007_s10853_012_6458_3 crossref_primary_10_1002_ijch_201400063 crossref_primary_10_1002_adma_201103010 crossref_primary_10_1002_aelm_201700007 crossref_primary_10_1002_adfm_200400337 crossref_primary_10_1002_smtd_202200007 crossref_primary_10_1002_adfm_201200058 crossref_primary_10_1021_ja076568q crossref_primary_10_1088_1361_648X_aafa4e crossref_primary_10_1002_adfm_200800056 crossref_primary_10_5402_2012_385415 crossref_primary_10_1002_aenm_201200077 crossref_primary_10_1002_adma_201800388 crossref_primary_10_1063_1_2779102 crossref_primary_10_1002_aenm_201200392 crossref_primary_10_1007_s10853_011_5474_z crossref_primary_10_1016_j_cplett_2009_09_052 crossref_primary_10_1016_j_solmat_2009_04_012 crossref_primary_10_1002_adfm_200601098 crossref_primary_10_1002_adfm_200600484 crossref_primary_10_1016_j_optcom_2011_12_019 crossref_primary_10_1016_j_orgel_2018_06_022 crossref_primary_10_1088_2515_7639_ac44d9 crossref_primary_10_1002_aelm_201500167 crossref_primary_10_1002_adma_201504417 crossref_primary_10_1103_PhysRevApplied_16_044026 crossref_primary_10_1070_QE2013v043n01ABEH014912 crossref_primary_10_1002_adma_201202873 crossref_primary_10_1016_j_solidstatesciences_2010_01_004 crossref_primary_10_1063_1_3041633 crossref_primary_10_1038_nmat5063 crossref_primary_10_1103_PRXEnergy_2_022001 crossref_primary_10_1063_5_0148079 crossref_primary_10_1002_adfm_200900090 crossref_primary_10_1007_s10853_011_5328_8 crossref_primary_10_1002_adfm_202006802 crossref_primary_10_1134_S0021364010070064 crossref_primary_10_1002_adfm_201400297 crossref_primary_10_1002_adom_202100670 crossref_primary_10_1002_adfm_200900797 crossref_primary_10_1002_adma_201603269 crossref_primary_10_1016_j_device_2024_100613 crossref_primary_10_1038_s41467_020_20856_z crossref_primary_10_1016_j_solmat_2011_09_061 crossref_primary_10_1063_1_5098304 crossref_primary_10_1016_j_matchemphys_2023_127650 crossref_primary_10_1109_JSTQE_2010_2043061 crossref_primary_10_1002_adma_200903712 crossref_primary_10_1039_c2jm15027a crossref_primary_10_1103_PhysRevApplied_13_024006 crossref_primary_10_1021_ma901350w crossref_primary_10_1039_b905249f crossref_primary_10_1002_aenm_201702816 crossref_primary_10_1016_j_mejo_2008_06_069 crossref_primary_10_1088_1555_6611_ad7723 crossref_primary_10_3390_ijms131217019 crossref_primary_10_1351_pac200880102151 crossref_primary_10_1007_s10853_012_6831_2 crossref_primary_10_1038_s41467_021_24500_2 crossref_primary_10_1039_b927324g crossref_primary_10_1146_annurev_physchem_040215_112144 crossref_primary_10_1002_aenm_201100083 crossref_primary_10_1002_polb_23139 crossref_primary_10_1016_j_tsf_2007_12_056 crossref_primary_10_1039_C0CP01710H crossref_primary_10_1038_s41467_019_13563_x crossref_primary_10_1002_admi_202202256 crossref_primary_10_1038_srep29437 crossref_primary_10_1038_nmat2548 crossref_primary_10_1002_aenm_201300981 crossref_primary_10_1007_s10853_012_7096_5 crossref_primary_10_1002_cphc_200900290 crossref_primary_10_1063_1_3656713 crossref_primary_10_1039_C9NR02020A crossref_primary_10_1007_s10853_012_6446_7 crossref_primary_10_1016_j_matchemphys_2012_10_017 crossref_primary_10_1002_adfm_200800411 crossref_primary_10_1002_aenm_201602360 crossref_primary_10_1039_c3cp52043a crossref_primary_10_1002_adfm_201304216 crossref_primary_10_1021_ja8012598 crossref_primary_10_1080_15980316_2019_1650838 crossref_primary_10_1021_ja203235z crossref_primary_10_1109_JSTQE_2010_2048746 crossref_primary_10_1039_C6CP00184J crossref_primary_10_1002_adfm_200902099 crossref_primary_10_1007_s10853_011_5801_4 crossref_primary_10_1002_aenm_201200361 crossref_primary_10_1016_j_trechm_2019_01_010 crossref_primary_10_1080_14686996_2018_1458579 |
| Cites_doi | 10.1002/adfm.200390011 10.1002/1616-3028(200102)11:1<15::AID-ADFM15>3.0.CO;2-A 10.1016/0301-0104(92)80012-K 10.1016/0038-1098(92)90636-N 10.1103/PhysRevB.25.5559 10.1126/science.258.5087.1474 10.1021/jp0113331 10.1016/S0379-6779(02)00603-3 10.1016/S0009-2614(01)00431-6 10.1103/PhysRevB.53.2187 10.1016/S1464-2859(04)00426-2 10.1143/JJAP.39.3627 10.1117/12.452453 10.1364/AO.20.001333 10.1109/94.933338 10.1016/j.cplett.2003.11.008 10.1002/(SICI)1521-3765(19980210)4:2<270::AID-CHEM270>3.0.CO;2-5 10.1016/0379-6779(92)90077-V 10.1016/S0379-6779(00)01361-8 10.1021/ma00108a079 10.1007/s00339-003-2497-6 10.1016/S0379-6779(99)00207-6 10.1063/1.1345834 10.1103/PhysRevB.47.13835 10.1016/S1567-1739(01)00007-4 |
| ContentType | Journal Article |
| Copyright | Journal of Materials Science is a copyright of Springer, (2005). All Rights Reserved. |
| Copyright_xml | – notice: Journal of Materials Science is a copyright of Springer, (2005). All Rights Reserved. |
| DBID | AAYXX CITATION 8FE 8FG ABJCF AFKRA BENPR BGLVJ CCPQU D1I DWQXO HCIFZ KB. L6V M7S PDBOC PHGZM PHGZT PKEHL PQEST PQGLB PQQKQ PQUKI PRINS PTHSS 7SR 8BQ 8FD JG9 7SP 7TB 7U5 FR3 L7M |
| DOI | 10.1007/s10853-005-0576-0 |
| DatabaseName | CrossRef ProQuest SciTech Collection ProQuest Technology Collection Materials Science & Engineering Collection ProQuest Central UK/Ireland ProQuest Central Technology Collection ProQuest One Community College ProQuest Materials Science Collection ProQuest Central Korea SciTech Premium Collection Materials Science Database ProQuest Engineering Collection Engineering Database Materials Science Collection ProQuest Central Premium ProQuest One Academic (New) ProQuest One Academic Middle East (New) ProQuest One Academic Eastern Edition (DO NOT USE) ProQuest One Applied & Life Sciences ProQuest One Academic (retired) ProQuest One Academic UKI Edition ProQuest Central China Engineering Collection Engineered Materials Abstracts METADEX Technology Research Database Materials Research Database Electronics & Communications Abstracts Mechanical & Transportation Engineering Abstracts Solid State and Superconductivity Abstracts Engineering Research Database Advanced Technologies Database with Aerospace |
| DatabaseTitle | CrossRef ProQuest Materials Science Collection Engineering Database Technology Collection ProQuest One Academic Middle East (New) ProQuest One Academic Eastern Edition Materials Science Collection SciTech Premium Collection ProQuest One Community College ProQuest Technology Collection ProQuest SciTech Collection ProQuest Central China ProQuest Central ProQuest One Applied & Life Sciences ProQuest Engineering Collection ProQuest One Academic UKI Edition ProQuest Central Korea Materials Science & Engineering Collection Materials Science Database ProQuest One Academic ProQuest Central (New) ProQuest One Academic (New) Engineering Collection Materials Research Database Engineered Materials Abstracts Technology Research Database METADEX Mechanical & Transportation Engineering Abstracts Electronics & Communications Abstracts Solid State and Superconductivity Abstracts Engineering Research Database Advanced Technologies Database with Aerospace |
| DatabaseTitleList | ProQuest Materials Science Collection Materials Research Database Materials Research Database |
| Database_xml | – sequence: 1 dbid: KB. name: Materials Science Database url: http://search.proquest.com/materialsscijournals sourceTypes: Aggregation Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1573-4803 |
| EndPage | 1418 |
| ExternalDocumentID | 10_1007_s10853_005_0576_0 |
| GroupedDBID | -XW -Y2 -~C -~X .4S .86 .DC .VR 06C 06D 0R~ 0VY 199 1N0 1SB 2.D 203 29K 29L 2J2 2JN 2JY 2KG 2KM 2LR 2P1 2VQ 2~H 30V 4.4 406 408 409 40D 40E 53G 5GY 5QI 5VS 67Z 6NX 6TJ 78A 8FE 8FG 8UJ 95- 95. 95~ 96X AAAVM AABHQ AACDK AAHBH AAHNG AAIAL AAIKT AAJBT AAJKR AANZL AAPKM AARHV AARTL AASML AATNV AATVU AAUYE AAWCG AAYIU AAYQN AAYTO AAYXX ABAKF ABBBX ABBRH ABBXA ABDBE ABDBF ABDEX ABDPE ABDZT ABECU ABFSG ABFTD ABFTV ABHLI ABHQN ABJCF ABJNI ABJOX ABKCH ABKTR ABMNI ABMQK ABNWP ABQBU ABQSL ABRTQ ABSXP ABTEG ABTHY ABTKH ABTMW ABULA ABWNU ABXPI ACAOD ACBXY ACDTI ACGFO ACGFS ACHSB ACHXU ACIWK ACKNC ACMDZ ACMLO ACOKC ACOMO ACPIV ACREN ACSTC ACUHS ACZOJ ADHHG ADHIR ADHKG ADIMF ADKNI ADKPE ADMLS ADRFC ADTPH ADURQ ADYFF ADYOE ADZKW AEBTG AEFIE AEFQL AEGAL AEGNC AEGXH AEJHL AEJRE AEKMD AEMSY AENEX AEOHA AEPYU AETLH AEVLU AEXYK AEZWR AFBBN AFDZB AFEXP AFFHD AFGCZ AFHIU AFKRA AFLOW AFOHR AFQWF AFWTZ AFYQB AFZKB AGAYW AGDGC AGGDS AGJBK AGMZJ AGQEE AGQMX AGQPQ AGRTI AGWIL AGWZB AGYKE AHAVH AHBYD AHKAY AHPBZ AHSBF AHWEU AHYZX AI. AIAGR AIAKS AIGIU AIIXL AILAN AITGF AIXLP AJBLW AJRNO AJZVZ ALMA_UNASSIGNED_HOLDINGS ALWAN AMKLP AMTXH AMXSW AMYLF AMYQR AOCGG ARCSS ARMRJ ASPBG ATHPR AVWKF AXYYD AYFIA AYJHY AZFZN B-. B0M BA0 BBWZM BDATZ BENPR BGLVJ BGNMA BSONS CAG CCPQU CITATION COF CS3 CSCUP D-I D1I DDRTE DL5 DNIVK DPUIP DU5 EAD EAP EAS EBLON EBS EDO EIOEI EJD EMK EPL ESBYG ESX FEDTE FERAY FFXSO FIGPU FINBP FNLPD FRRFC FSGXE FWDCC G-Y G-Z GGCAI GGRSB GJIRD GNWQR GQ7 GQ8 GXS H13 HCIFZ HF~ HG5 HG6 HMJXF HQYDN HRMNR HVGLF HZ~ I-F I09 IAO IGS IHE IJ- IKXTQ ISR ITC ITM IWAJR IXC IZIGR IZQ I~X I~Z J-C J0Z JBSCW JCJTX JZLTJ KB. KDC KOV KOW L6V LAK LLZTM M4Y M7S MA- MK~ N2Q N9A NB0 NDZJH NPVJJ NQJWS NU0 O9- O93 O9G O9I O9J OAM OVD P0- P19 P2P P9N PDBOC PF- PHGZM PHGZT PQGLB PT4 PT5 PTHSS QF4 QM1 QN7 QO4 QOK QOR QOS R4E R89 R9I RHV RNI RNS ROL RPX RSV RZC RZE RZK S16 S1Z S26 S27 S28 S3B SAP SCG SCLPG SCM SDH SHX SISQX SJYHP SNE SNPRN SNX SOHCF SOJ SPISZ SRMVM SSLCW STPWE SZN T13 T16 T9H TAE TEORI TN5 TSG TSK TSV TUC TUS U2A UG4 UOJIU UTJUX UZXMN VC2 VFIZW VH1 W23 W48 W4F WH7 WJK WK8 YLTOR Z45 ZE2 ZMTXR ZY4 ~02 ~8M ~EX AESKC DWQXO PKEHL PQEST PQQKQ PQUKI PRINS 7SR 8BQ 8FD AAYZH JG9 PUEGO 7SP 7TB 7U5 FR3 L7M |
| ID | FETCH-LOGICAL-c403t-898fbff16efb8585a11d06753a5c48b615c7426ee7a0c09d4b43193d1660f67d3 |
| IEDL.DBID | M7S |
| ISICitedReferencesCount | 140 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000227956200018&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0022-2461 |
| IngestDate | Thu Sep 04 15:50:11 EDT 2025 Fri Sep 05 08:19:34 EDT 2025 Wed Nov 05 00:46:39 EST 2025 Sat Nov 29 06:20:35 EST 2025 Tue Nov 18 22:34:26 EST 2025 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 6 |
| Language | English |
| License | http://www.springer.com/tdm |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c403t-898fbff16efb8585a11d06753a5c48b615c7426ee7a0c09d4b43193d1660f67d3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 ObjectType-Article-2 ObjectType-Feature-1 content type line 23 |
| PQID | 2259709344 |
| PQPubID | 23500 |
| PageCount | 6 |
| ParticipantIDs | proquest_miscellaneous_28490941 proquest_miscellaneous_1082171971 proquest_journals_2259709344 crossref_primary_10_1007_s10853_005_0576_0 crossref_citationtrail_10_1007_s10853_005_0576_0 |
| PublicationCentury | 2000 |
| PublicationDate | 2005-3-00 20050301 |
| PublicationDateYYYYMMDD | 2005-03-01 |
| PublicationDate_xml | – month: 03 year: 2005 text: 2005-3-00 |
| PublicationDecade | 2000 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York |
| PublicationTitle | Journal of materials science |
| PublicationYear | 2005 |
| Publisher | Springer Nature B.V |
| Publisher_xml | – name: Springer Nature B.V |
| References | L. SMILOWITZ (576_CR9) 1993; 47 S. LEACH (576_CR25) 1992; 160 C. J. BRABEC (576_CR4) 2001; 11 S. J. MESKERS (576_CR20) 2001; 105 T. FUJII (576_CR15) 2000; 39 I. MONTANARI (576_CR12) 2002; 81 F. LOUWET (576_CR18) 1995; 28 H. BÄSSLER (576_CR22) 2003; 135/136 S. J. MESKERS (576_CR21) 2001; 8 576_CR2 H. KIM (576_CR26) 2001; 1 X. WEI (576_CR10) 1996; 53 576_CR6 M. TZOLOV (576_CR17) 2001; 122 F. PADINGER (576_CR5) 2003; 13 S. E. SHAHEEN (576_CR1) 2001; 78 W. B. JACKSON (576_CR14) 1982; 25 C. H. SEAGER (576_CR19) 1992; 49/50 S. MORITA (576_CR8) 1992; 82 N. S. SARICIFTCI (576_CR7) 1992; 258 C. J. BRABEC (576_CR11) 2001; 340 V. I. ARKHIPOV (576_CR23) 2004; 383 R. V. BENSASSON (576_CR24) 1998; 4 T. MARTENS (576_CR3) 2004; 79 W. B. JACKSON (576_CR13) 1981; 20 M. TZOLOV (576_CR16) 2000; 109 |
| References_xml | – volume: 13 start-page: 85 issue: 1 year: 2003 ident: 576_CR5 publication-title: Adv. Funct. Mater. doi: 10.1002/adfm.200390011 – volume: 11 start-page: 15 issue: 1 year: 2001 ident: 576_CR4 publication-title: Adv. Funct. Mater. doi: 10.1002/1616-3028(200102)11:1<15::AID-ADFM15>3.0.CO;2-A – volume: 160 start-page: 451 issue: 3 year: 1992 ident: 576_CR25 publication-title: Chem. Phys. doi: 10.1016/0301-0104(92)80012-K – volume: 82 start-page: 249 issue: 4 year: 1992 ident: 576_CR8 publication-title: Solid State Commun. doi: 10.1016/0038-1098(92)90636-N – volume: 25 start-page: 5559 issue: 8 year: 1982 ident: 576_CR14 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.25.5559 – volume: 258 start-page: 1474 year: 1992 ident: 576_CR7 publication-title: Science doi: 10.1126/science.258.5087.1474 – volume: 105 start-page: 9139 year: 2001 ident: 576_CR20 publication-title: J. Phys. Chem. B doi: 10.1021/jp0113331 – volume: 135/136 start-page: 377 year: 2003 ident: 576_CR22 publication-title: Synth. Metals doi: 10.1016/S0379-6779(02)00603-3 – volume: 340 start-page: 232 issue: 3/4 year: 2001 ident: 576_CR11 publication-title: Chem. Phys. Lett. doi: 10.1016/S0009-2614(01)00431-6 – volume: 53 start-page: 2187 issue: 5 year: 1996 ident: 576_CR10 publication-title: Phys. Rev. B. doi: 10.1103/PhysRevB.53.2187 – volume: 81 start-page: 3001 issue: 16 year: 2002 ident: 576_CR12 publication-title: Chem. Phys. Lett. – ident: 576_CR6 doi: 10.1016/S1464-2859(04)00426-2 – volume: 39 start-page: 3627 year: 2000 ident: 576_CR15 publication-title: Jpn. J. Appl. Phys. doi: 10.1143/JJAP.39.3627 – ident: 576_CR2 doi: 10.1117/12.452453 – volume: 20 start-page: 1333 issue: 8 year: 1981 ident: 576_CR13 publication-title: Appl. Opt. doi: 10.1364/AO.20.001333 – volume: 8 start-page: 321 issue: 3 year: 2001 ident: 576_CR21 publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/94.933338 – volume: 383 start-page: 166 year: 2004 ident: 576_CR23 publication-title: Chem. Phys. Lett. doi: 10.1016/j.cplett.2003.11.008 – volume: 4 start-page: 270 issue: 2 year: 1998 ident: 576_CR24 publication-title: Chem. A Europ. J. doi: 10.1002/(SICI)1521-3765(19980210)4:2<270::AID-CHEM270>3.0.CO;2-5 – volume: 49/50 start-page: 91 year: 1992 ident: 576_CR19 publication-title: Synthetic Metals doi: 10.1016/0379-6779(92)90077-V – volume: 122 start-page: 55 year: 2001 ident: 576_CR17 publication-title: Synth. Metals doi: 10.1016/S0379-6779(00)01361-8 – volume: 28 start-page: 1330 year: 1995 ident: 576_CR18 publication-title: Macromolecules doi: 10.1021/ma00108a079 – volume: 79 start-page: 27 issue: 1 year: 2004 ident: 576_CR3 publication-title: Appl. Phys. A-Mater. Sci. Proc. doi: 10.1007/s00339-003-2497-6 – volume: 109 start-page: 85 year: 2000 ident: 576_CR16 publication-title: Synth. Metals doi: 10.1016/S0379-6779(99)00207-6 – volume: 78 start-page: 841 issue: 6 year: 2001 ident: 576_CR1 publication-title: Appl. Phys. Lett. doi: 10.1063/1.1345834 – volume: 47 start-page: 13835 issue: 20 year: 1993 ident: 576_CR9 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.47.13835 – volume: 1 start-page: 139 year: 2001 ident: 576_CR26 publication-title: Curr. Appl. Phys. doi: 10.1016/S1567-1739(01)00007-4 |
| SSID | ssj0005721 |
| Score | 2.187369 |
| Snippet | A high sensitive approach is presented to detect in particular the low level absorption features in pure and blended organic semiconductor films, revealing... |
| SourceID | proquest crossref |
| SourceType | Aggregation Database Enrichment Source Index Database |
| StartPage | 1413 |
| SubjectTerms | Absorptivity Blended Defects Ground state Materials science Morphology Nanostructure Photothermal deflection spectroscopy Photovoltaic cells Solar cells Spectra Spectrum analysis Thin films Transmission electron microscopy |
| Title | Absorption phenomena in organic thin films for solar cell applications investigated by photothermal deflection spectroscopy |
| URI | https://www.proquest.com/docview/2259709344 https://www.proquest.com/docview/1082171971 https://www.proquest.com/docview/28490941 |
| Volume | 40 |
| WOSCitedRecordID | wos000227956200018&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVPQU databaseName: Engineering Database customDbUrl: eissn: 1573-4803 dateEnd: 20181231 omitProxy: false ssIdentifier: ssj0005721 issn: 0022-2461 databaseCode: M7S dateStart: 19970101 isFulltext: true titleUrlDefault: http://search.proquest.com providerName: ProQuest – providerCode: PRVPQU databaseName: Materials Science Database customDbUrl: eissn: 1573-4803 dateEnd: 20181231 omitProxy: false ssIdentifier: ssj0005721 issn: 0022-2461 databaseCode: KB. dateStart: 19970101 isFulltext: true titleUrlDefault: http://search.proquest.com/materialsscijournals providerName: ProQuest – providerCode: PRVPQU databaseName: ProQuest Central customDbUrl: eissn: 1573-4803 dateEnd: 20181231 omitProxy: false ssIdentifier: ssj0005721 issn: 0022-2461 databaseCode: BENPR dateStart: 19970101 isFulltext: true titleUrlDefault: https://www.proquest.com/central providerName: ProQuest – providerCode: PRVAVX databaseName: SpringerLINK Contemporary 1997-Present customDbUrl: eissn: 1573-4803 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0005721 issn: 0022-2461 databaseCode: RSV dateStart: 19970101 isFulltext: true titleUrlDefault: https://link.springer.com/search?facet-content-type=%22Journal%22 providerName: Springer Nature |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1La9wwEB6apIfm0HfJtslWhZ4Kaq21LNmnkpSEQmEJSVtyM3qZLmzszdoJhP75zmjtbHJoLrkYbEuW8IzmoRl9A_BRpqbIhUq4FUFzmU9Sjg8CR1aRShlrrPex2ISeTvOzs-K433Br-7TKQSZGQe0bR3vkX5DvCo3ut5RfFxecqkZRdLUvobEBW4SSIGLq3uk6xUNPxIAWTrhpQ1RzdXQOFRUnHE5shk71Xb10VyxHXXP07KGzfA5PeyuT7a_Y4gU8CvVL2L6FPfgK_u7btllGgcEoz4uQGAyb1WxV58mx7g_eVLP5ecvQsGUt-cCM9vnZ7aA39hiAOoJn9hq_1XTxVNc5TsCHah5zvWoWj3QSdGazuH4Nv44Of377zvtKDNzJJO14XuSVrSqhQmUpkGiE8ORqpCZzMrdoFTl0sVUI2iQuKby0aJcUqRdKJZXSPn0Dm3VThx1gZqJyHbIqk85IZ7XJQhDOZsbbxIrMjiAZ6FC6HqacqmXMyzXAMpGuRNKVRLoyGcGnmy6LFUbHfY13B8qV_XJtyzXZRvDh5jUuNPqrpg7NZUtIqui-iUKLEbz_TxvU9QX6y-Lt_YO8gycRATamsu3CZre8DHvw2F11s3Y5hq2Dw-nxyRg2fhx8HkeOxuvJ6e9_a0b_Ew |
| linkProvider | ProQuest |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMw1V1Lb9QwEB6VggQceKMuFGokuCBFtRPHjg8IVUDVqmWFRJF6C35FrLRNtpsUtOI_8RsZO5tue6C3HjgmsZ3E_jKPzPgbgNc806pggiaGeZnwIs0SPOEThAoXQhttnIvFJuR4XBwfqy9r8GfYCxPSKgeZGAW1a2z4R76NuFMS3W_O389Ok1A1KkRXhxIaPSwO_OIXumztu_2PuL5v0nT309GHvWRZVSCxnGZdUqiiMlXFhK9MCIppxlwwmzOdW14Y1PAW3UXhvdTUUuW4QR2rMseEoJWQLsNxb8BNNCNSFVMFv65SSmTKBnbywNM2RFH7rXqoGJPA-4nN0Im_rAcvq4Go23bv_2-z8gDuLa1ostPD_iGs-foR3L3ArfgYfu-YtplHgUhCHltgmtBkUpO-jpUl3Q88qCbTk5ag4U7a4OOTEMcgF4P62GMgIvGOmAWO1XRx19oJPoDz1TTmstUkblkN1KDNbPEEvl3L2z-F9bqp_QYQnYpC-rzKudXcGqlz75k1uXaGGpabEdBh3Uu7pGEP1UCm5YpAOkClRKiUASolHcHb8y6znoPkqsabA1LKpThqyxVMRvDq_DIKkjCruvbNWRuYYtE9ZUqyEWz9ow3aMooqzp5dfZMtuL139PmwPNwfHzyHO5HtNqbtbcJ6Nz_zL-CW_dlN2vnL-P0Q-H7d0PwLIbNXMQ |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Absorption+phenomena+in+organic+thin+films+for+solar+cell+applications+investigated+by+photothermal+deflection+spectroscopy&rft.jtitle=Journal+of+materials+science&rft.au=Goris%2C+L&rft.au=Haenen%2C+K&rft.au=Nesl%C3%A1dek%2C+M&rft.au=Wagner%2C+P&rft.date=2005-03-01&rft.pub=Springer+Nature+B.V&rft.issn=0022-2461&rft.eissn=1573-4803&rft.volume=40&rft.issue=6&rft.spage=1413&rft.epage=1418&rft_id=info:doi/10.1007%2Fs10853-005-0576-0 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0022-2461&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0022-2461&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0022-2461&client=summon |