Flexible and modular virtual scanning probe microscope

Non-contact Atomic Force Microscopy (NC-AFM) is an experimental technique capable of imaging almost any surface with atomic resolution, in a wide variety of environments. Linking measured images to real understanding of system properties is often difficult, and many studies combine experiments with...

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Bibliographic Details
Published in:	Computer physics communications Vol. 196; pp. 429 - 438
Main Authors:	Tracey, John, Federici Canova, Filippo, Keisanen, Olli, Gao, David Z., Spijker, Peter, Reischl, Bernhard, Foster, Adam S.
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01.11.2015
Subjects:	Atomic force microscopes Atomic force microscopy Computer simulation Mathematical models Modular NC-AFM Programming languages Python Simulation SPM Stress concentration Summaries SPM Simulation NC-AFM Python
ISSN:	0010-4655, 1879-2944
Online Access:	Get full text
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