Wave propagation simulation based on the Fourier diffraction integral for X-ray refraction contrast imaging-computed tomography

With the advent of coherent X-ray sources, X-ray refraction has begun to be utilized for X-ray imaging of unprecedented sensitivity. The aim of this study was to develop a wave propagation simulator that provides a map of X-ray refraction after passing through an object. We applied the Fresnel diffr...

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Bibliographic Details
Published in:Journal of the Korean Physical Society Vol. 69; no. 6; pp. 1098 - 1104
Main Authors: Chang, Won-Seok, Kim, Jong-Ki, Cho, Jin-Ho, Lim, Jae-Hong
Format: Journal Article
Language:English
Published: Seoul The Korean Physical Society 01.09.2016
Springer Nature B.V
한국물리학회
Subjects:
Computed tomography
Fresnel diffraction
Image reconstruction
Imaging techniques
Mathematical and Computational Physics
Medical imaging
Particle and Nuclear Physics
Physics
Physics and Astronomy
Refractivity
Soft tissues
Theoretical
Wave diffraction
Wave propagation
X ray imagery
X ray refraction
X ray sources
물리학
Wave simulation
Virtual phantom
In-plane CT
DEI
Diffraction-enhanced imaging
Refraction contrast
Image reconstruction
Wave propagation
Computed tomography
Fresnel diffraction integral
Analyzer-based phase contrast imaging
X-ray
map
ISSN:0374-4884, 1976-8524
Online Access:Get full text
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Summary:With the advent of coherent X-ray sources, X-ray refraction has begun to be utilized for X-ray imaging of unprecedented sensitivity. The aim of this study was to develop a wave propagation simulator that provides a map of X-ray refraction after passing through an object. We applied the Fresnel diffraction integral for calculating the propagated wave and then obtained the refraction map by differentiating the phase in the refraction-analyzing direction. The simulation was validated by comparing the computed tomography (CT) reconstruction of a virtual phantom with its map of refractive index: the deviations were below 0.7% for soft tissues under our test condition. The simulator can be used for testing and developing highly-sensitive X-ray imaging techniques based on X-ray refraction analysis prior to experimentation.
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G704-000411.2016.69.6.016
ISSN:0374-4884
1976-8524
DOI:10.3938/jkps.69.1098