Effect of specimen configuration on deterioration of silicone rubber for polymer insulators in salt fog ageing test

The paper investigates the effects of specimen configuration on the deterioration of silicone rubber insulators in a salt fog ageing test. A cyclic salt fog ageing test was conducted on three types of high-temperature vulcanized silicone rubber (HTV SiR) specimens: two types of insulators having she...

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Vydáno v:IEEE transactions on dielectrics and electrical insulation Ročník 13; číslo 1; s. 129 - 138
Hlavní autoři: Marungsri, B., Shinokubo, H., Matsuoka, R., Kumagai, S.
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York IEEE 01.02.2006
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:
Aging
Deterioration
Dielectrics and electrical insulation
Erosion
Fiber reinforced plastics
Fog
Insulator testing
Insulators
Leakage
Machine intelligence
Plastic insulation
Polymers
Protection
Rubber
Sheds
Silicone rubber
System testing
ISSN:1070-9878, 1558-4135
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Abstract The paper investigates the effects of specimen configuration on the deterioration of silicone rubber insulators in a salt fog ageing test. A cyclic salt fog ageing test was conducted on three types of high-temperature vulcanized silicone rubber (HTV SiR) specimens: two types of insulators having sheds, and plain rods without sheds. The test was based fundamentally on the CIGRE WG 15-04 specifications. After 50 test cycles, the three types of specimens showed different degrees of surface deterioration. Erosion on the straight shed insulator was more severe than that on the alternate shed insulator even though the two had the same leakage distance. No erosion was observed on the rod-type specimens, which had shorter leakage distances than the insulator-type specimens.
AbstractList The paper investigates the effects of specimen configuration on the deterioration of silicone rubber insulators in a salt fog ageing test. A cyclic salt fog ageing test was conducted on three types of high-temperature vulcanized silicone rubber (HTV SiR) specimens: two types of insulators having sheds, and plain rods without sheds. The test was based fundamentally on the CIGRE WG 15-04 specifications. After 50 test cycles, the three types of specimens showed different degrees of surface deterioration. Erosion on the straight shed insulator was more severe than that on the alternate shed insulator even though the two had the same leakage distance. No erosion was observed on the rod-type specimens, which had shorter leakage distances than the insulator-type specimens.
Author Marungsri, B.
Matsuoka, R.
Kumagai, S.
Shinokubo, H.
Author_xml – sequence: 1
  givenname: B.
  surname: Marungsri
  fullname: Marungsri, B.
  organization: Dept. of Electr. Eng., Chubu Univ., Aichi, Japan
– sequence: 2
  givenname: H.
  surname: Shinokubo
  fullname: Shinokubo, H.
  organization: Dept. of Electr. Eng., Chubu Univ., Aichi, Japan
– sequence: 3
  givenname: R.
  surname: Matsuoka
  fullname: Matsuoka, R.
  organization: Dept. of Electr. Eng., Chubu Univ., Aichi, Japan
– sequence: 4
  givenname: S.
  surname: Kumagai
  fullname: Kumagai, S.
BookMark eNp9kU9rXCEUxSWkkGTaDxC6kS5KN2-qzz_vuSzJNAkEuknXor7rYHijU_Ut8u3rdCYUsggIHry_cy_ec4XOY4qA0DUla0qJ-v50u3lY94TINRWKcUrP0CUVYuw4ZeK8aTKQTo3DeIGuSnkmhHLRy0tUNt6Dqzh5XPbgwg4idin6sF2yqSFF3M4EFXJIrw8NDXNoFOC8WAsZ-5TxPs0vu6ZDLMtsasqlSVzMXFt5i80WQtziCqV-RB-8mQt8Ot0r9Pvn5unmvnv8dfdw8-Oxc0wNtaMWuO0lU4p4ZRn31ksiDBecTcpIT1nvuIDRTs73chReWqv8QBmbJmOFYSv09dh3n9OfpQ3Wu1AczLOJkJai-5GwUcixgd_eBSmToi1TUNLQL2_Q57Tk2L6hFe0pZ6zNX6HhCLmcSsngtQv13_JqNmHWlOhDaPoQmj6Epk-hNSd949znsDP55V3P56MnAMB__lT9C-l0pd0
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
F28
FR3
DOI 10.1109/TDEI.2006.1593411
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList Engineering Research Database
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1558-4135
EndPage 138
ExternalDocumentID 2544222711
10_1109_TDEI_2006_1593411
1593411
Genre orig-research
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
RXW
TAE
TAF
TN5
VH1
AAYXX
CITATION
7SP
8FD
L7M
RIG
F28
FR3
ID FETCH-LOGICAL-c397t-1be4b263990f9b34fbf605a4543d9a6f132c45e8bdcf2685f6bb9f7133ddab5a3
IEDL.DBID RIE
ISICitedReferencesCount 56
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000235419200018&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1070-9878
IngestDate Sun Sep 28 10:50:57 EDT 2025
Sat Sep 27 20:00:54 EDT 2025
Mon Jun 30 10:18:15 EDT 2025
Sat Nov 29 03:10:54 EST 2025
Tue Nov 18 19:50:37 EST 2025
Wed Aug 27 02:48:55 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 1
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c397t-1be4b263990f9b34fbf605a4543d9a6f132c45e8bdcf2685f6bb9f7133ddab5a3
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 14
content type line 23
PQID 912143313
PQPubID 23500
PageCount 10
ParticipantIDs proquest_journals_912143313
crossref_citationtrail_10_1109_TDEI_2006_1593411
ieee_primary_1593411
crossref_primary_10_1109_TDEI_2006_1593411
proquest_miscellaneous_1365155510
proquest_miscellaneous_28038568
PublicationCentury 2000
PublicationDate 2006-02-01
PublicationDateYYYYMMDD 2006-02-01
PublicationDate_xml – month: 02
  year: 2006
  text: 2006-02-01
  day: 01
PublicationDecade 2000
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on dielectrics and electrical insulation
PublicationTitleAbbrev T-DEI
PublicationYear 2006
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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SSID ssj0014526
Score 2.046214
Snippet The paper investigates the effects of specimen configuration on the deterioration of silicone rubber insulators in a salt fog ageing test. A cyclic salt fog...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 129
SubjectTerms Aging
Deterioration
Dielectrics and electrical insulation
Erosion
Fiber reinforced plastics
Fog
Insulator testing
Insulators
Leakage
Machine intelligence
Plastic insulation
Polymers
Protection
Rubber
Sheds
Silicone rubber
System testing
Title Effect of specimen configuration on deterioration of silicone rubber for polymer insulators in salt fog ageing test
URI https://ieeexplore.ieee.org/document/1593411
https://www.proquest.com/docview/912143313
https://www.proquest.com/docview/1365155510
https://www.proquest.com/docview/28038568
Volume 13
WOSCitedRecordID wos000235419200018&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-4135
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014526
  issn: 1070-9878
  databaseCode: RIE
  dateStart: 19940101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS-QwEB9UFM4H9fTE9esi-CRXt9022eRR_MCDQ3zwwLfSfMnCupVtK_jfO5N295TzDoQ-hGbahEwymV9mMgNwTDE-UpuQ5qYQoBQDFRWxFpERVmluuDc-cPrX8OZG3t-r2wX4Mb8L45wLzmfulIrBlm9L09BRWR-3XhS6iHUWh0PR3tWaWwwoVXbrXxhHiKNlZ8FMYtW_u7j82Zoduh-824NCUpW_JHHYXq7WP9exDVjr1Eh21vL9Kyy4ySasvgkuuAkrwbnTVFtQtSGKWekZXaykeP4MYbAfPTQt_xk-lvxiRuXsBZKOxjhLJo5NG63dlKF2y57K8csjloMHO8H1CousKsY1Vj8wlE3YNEPttf4Gv68u786voy7ZQmRQJamjRLtMD0hfib3Saea1R6RTZDxLrSqER9RqMu6ktsYPhOReaK08QVxrC82LdBuWJtipHWBGOGlj7RD72ozHTnIrM6clN4m3wiY9iGfDn5suEjklxBjnAZHEKieOUYJMkXcj24OT-SdPbRiO_xFvEYv-EM5e7814nHcLtcpVMkjo0ljag6N5La4wMpsUE1c2VU6OgKh1ofDqwfd_0FCOL8mF3P246T340h7dkBvMPizV08YdwLJ5rkfV9DBM5FdMRfJD
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Lb9QwEB5VBUQ58GhBXQrUSJwQoU5iG_uIoFUrlhWHReotil_VSsum2iRI_HtmnOwC4iEh5WDFk9jy-DGf5wXwgmJ8lD4nyc0gQKkLk9Xcqswpb6x0MrqYOD19M5vpy0vzaQdebX1hQgjJ-Cy8pmLS5fvG9XRVdoJHL266iHVuSCEKPnhrbXUGlCx7sDDkGSJpPeowc25O5u9PLwbFw_iLX06hlFblt704HTBn9_6va_fh7ihIsrcD5x_ATljtw52fwgvuw61k3unaA2iHIMWsiYxcKymiP0MgHBdX_TADGD6eLGMWzeYFki6WOE9Wga17a8OaoXzLrpvlty9YTjbsBNhbLLK2XnZYfcVwd8KmGcqv3UP4fHY6f3eejekWModCSZflNghbkMTCo7GliDYi1qmFFKU3tYqIW52QQVvvYqG0jMpaEwnkel9bWZePYHeFnToE5lTQntuA6NcLyYOWXotgtXR59MrnE-Cb4a_cGIucUmIsq4RJuKmIY5QiU1XjyE7g5faT6yEQx7-ID4hFPwg3r482PK7GpdpWJi9ychsrJ_B8W4trjBQn9So0fVuRKSDKXbh9TeD4LzSU5UtLpR__ueljuH0-_zitphezD0ewN1zkkFHME9jt1n14Cjfd127Rrp-lSf0dBQ31ig
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Effect+of+specimen+configuration+on+deterioration+of+silicone+rubber+for+polymer+insulators+in+salt+fog+ageing+test&rft.jtitle=IEEE+transactions+on+dielectrics+and+electrical+insulation&rft.au=Marungsri%2C+B&rft.au=Shinokubo%2C+H&rft.au=Matsuoka%2C+R&rft.au=Kumagai%2C+S&rft.date=2006-02-01&rft.issn=1070-9878&rft.volume=13&rft.issue=1&rft.spage=129&rft.epage=138&rft_id=info:doi/10.1109%2FTDEI.2006.1593411&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1070-9878&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1070-9878&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1070-9878&client=summon