High precision optical characterization of semiconductor saturable absorber mirrors

Semiconductor saturable absorber mirrors (SESAMs) have become a key element of many ultrafast laser sources, enabling passively modelocked lasers with >100 GHz repetition rate or with >10 microJ pulse energy. Precise knowledge of the nonlinear optical reflectivity is required to optimize the S...

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Vydané v:Optics express Ročník 16; číslo 10; s. 7571
Hlavní autori: Maas, D. J., Rudin, B., Bellancourt, A.-R., Iwaniuk, D., Marchese, S. V., Südmeyer, T., Keller, U.
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: United States 12.05.2008
ISSN:1094-4087, 1094-4087
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Shrnutí:Semiconductor saturable absorber mirrors (SESAMs) have become a key element of many ultrafast laser sources, enabling passively modelocked lasers with >100 GHz repetition rate or with >10 microJ pulse energy. Precise knowledge of the nonlinear optical reflectivity is required to optimize the SESAMs for self-starting passive modelocking at record high repetition rates or pulse energies. In this article, we discuss a new method for wide dynamic range nonlinear reflectivity measurements. We achieve a higher accuracy (<0.05%) with a simpler and more cost-efficient measurement scheme compared with previous measurement systems. The method can easily be implemented for arbitrary wavelength regions and fluence ranges.
Bibliografia:ObjectType-Article-1
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.16.007571