Scalable Topological Data Analysis and Visualization for Evaluating Data-Driven Models in Scientific Applications

With the rapid adoption of machine learning techniques for large-scale applications in science and engineering comes the convergence of two grand challenges in visualization. First, the utilization of black box models (e.g., deep neural networks) calls for advanced techniques in exploring and interp...

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Bibliographic Details
Published in:IEEE transactions on visualization and computer graphics Vol. 26; no. 1; pp. 291 - 300
Main Authors: Liu, Shusen, Gaffney, Jim, Peterson, Luc, Robinson, Peter B., Bhatia, Harsh, Pascucci, Valerio, Spears, Brian K., Bremer, Peer-Timo, Wang, Di, Maljovec, Dan, Anirudh, Rushil, Thiagarajan, Jayaraman J., Jacobs, Sam Ade, Van Essen, Brian C., Hysom, David, Yeom, Jae-Seung
Format: Journal Article
Language:English
Published: United States IEEE 01.01.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:1077-2626, 1941-0506, 1941-0506
Online Access:Get full text
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