APA (7th ed.) Citation

Wu, Y., Li, Z., Liu, Y., & Chen, X. (2020). FATOC: Bug Isolation Based Multi-Fault Localization by Using OPTICS Clustering. Journal of computer science and technology, 35(5), 979-998. https://doi.org/10.1007/s11390-020-0549-4

Chicago Style (17th ed.) Citation

Wu, Yong-Hao, Zheng Li, Yong Liu, and Xiang Chen. "FATOC: Bug Isolation Based Multi-Fault Localization by Using OPTICS Clustering." Journal of Computer Science and Technology 35, no. 5 (2020): 979-998. https://doi.org/10.1007/s11390-020-0549-4.

MLA (9th ed.) Citation

Wu, Yong-Hao, et al. "FATOC: Bug Isolation Based Multi-Fault Localization by Using OPTICS Clustering." Journal of Computer Science and Technology, vol. 35, no. 5, 2020, pp. 979-998, https://doi.org/10.1007/s11390-020-0549-4.