Two Dimensional Multi-Release Software Reliability Modeling and Optimal Release Planning
Long-lived software systems evolve through new product releases, which involve up-gradation of previous released versions of the software in the market. But, upgrades in software lead to an increase in the fault content. Thus, for modeling the reliability growth of software with multiple releases, w...
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| Vydáno v: | IEEE transactions on reliability Ročník 61; číslo 3; s. 758 - 768 |
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| Hlavní autoři: | , , , |
| Médium: | Journal Article |
| Jazyk: | angličtina |
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New York
IEEE
01.09.2012
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 0018-9529, 1558-1721 |
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| Abstract | Long-lived software systems evolve through new product releases, which involve up-gradation of previous released versions of the software in the market. But, upgrades in software lead to an increase in the fault content. Thus, for modeling the reliability growth of software with multiple releases, we must consider the failures of the upcoming upgraded release, and the failures that were not debugged in the previous release. Based on this idea, this paper proposes a mathematical modeling framework for multiple releases of software products. The proposed model takes into consideration the combined effect of schedule pressure and resource limitations using a Cobb Douglas production function in modeling the failure process using a software reliability growth model. The model developed is validated on a four release failure data set. Another major concern for the software development firms is to plan the release of the upgraded version. When different versions of the software are to be released, then the firm plans the release on the basis of testing progress of the new code, as well as the bugs reported during the operational phase of the previous version. In this paper, we formulate an optimal release planning problem which minimizes the cost of testing of the release that is to be brought into market under the constraint of removing a desired proportion of faults from the current release. The problem is illustrated using a numerical example, and is solved using a genetic algorithm. |
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| AbstractList | Long-lived software systems evolve through new product releases, which involve up-gradation of previous released versions of the software in the market. But, upgrades in software lead to an increase in the fault content. Thus, for modeling the reliability growth of software with multiple releases, we must consider the failures of the upcoming upgraded release, and the failures that were not debugged in the previous release. Based on this idea, this paper proposes a mathematical modeling framework for multiple releases of software products. The proposed model takes into consideration the combined effect of schedule pressure and resource limitations using a Cobb Douglas production function in modeling the failure process using a software reliability growth model. The model developed is validated on a four release failure data set. Another major concern for the software development firms is to plan the release of the upgraded version. When different versions of the software are to be released, then the firm plans the release on the basis of testing progress of the new code, as well as the bugs reported during the operational phase of the previous version. In this paper, we formulate an optimal release planning problem which minimizes the cost of testing of the release that is to be brought into market under the constraint of removing a desired proportion of faults from the current release. The problem is illustrated using a numerical example, and is solved using a genetic algorithm. |
| Author | Kaur, G. Kapur, P. K. Pham, H. Aggarwal, A. G. |
| Author_xml | – sequence: 1 givenname: P. K. surname: Kapur fullname: Kapur, P. K. organization: Amity Int. Bus. Sch., Amity Univ., Noida, India – sequence: 2 givenname: H. surname: Pham fullname: Pham, H. organization: Rutgers Univ., Piscataway, NJ, USA – sequence: 3 givenname: A. G. surname: Aggarwal fullname: Aggarwal, A. G. organization: Dept. of Operational Res., Univ. of Delhi, Delhi, India – sequence: 4 givenname: G. surname: Kaur fullname: Kaur, G. organization: Dept. of Operational Res., Univ. of Delhi, Delhi, India |
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| References | ref35 ref13 ref34 ref12 khoshogoftaar (ref33) 1988 ref36 ref14 ref31 ref30 kapur (ref20) 2011 kapurand (ref23) 1991; 22 ref11 kapur (ref22) 2010 ref32 lyu (ref16) 1996 ref2 ref1 ref17 ref18 musa (ref10) 1987 beizer (ref3) 1990 kapur (ref21) 1999 pham (ref7) 2006 ref24 ref26 ref25 musa (ref9) 1984 goldberg (ref6) 1989 ohba (ref15) 1984 ref28 ref27 ref29 ref8 kapur (ref19) 1992; 7 ref4 ref5 |
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| SubjectTerms | Computer programs Failure Genetic algorithms Markets Mathematical model Mathematical models Multi-release planning Optimization Planning Software Software reliability software reliability growth model Studies Testing two dimensional software reliability growth model Upgrading |
| Title | Two Dimensional Multi-Release Software Reliability Modeling and Optimal Release Planning |
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