YOLOv3-MSSA based hot spot defect detection for photovoltaic power stations
With the continuous development of the energy industry, photovoltaic power generation is gradually becoming one of the main power generation methods. However, detecting hot spot defects in photovoltaic power stations is challenging. Therefore, enhancing detection efficiency using information technol...
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| Vydáno v: | Journal of Measurements in Engineering Ročník 12; číslo 1; s. 23 - 39 |
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| Hlavní autoři: | , |
| Médium: | Journal Article |
| Jazyk: | angličtina |
| Vydáno: |
Kaunas
JVE International Ltd
01.03.2024
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| Témata: | |
| ISSN: | 2335-2124, 2424-4635 |
| On-line přístup: | Získat plný text |
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| Shrnutí: | With the continuous development of the energy industry, photovoltaic power generation is gradually becoming one of the main power generation methods. However, detecting hot spot defects in photovoltaic power stations is challenging. Therefore, enhancing detection efficiency using information technology has become a crucial aspect. The study presents a defect detection model for PV power stations using the YOLOv3 (You Only Look Once v3) algorithm. The model incorporates coordinate attention module (CAM) and self-attention module (SAM) to improve feature extraction in low-resolution conditions. The Multi objective Sparrow is employed to achieve multiple objectives. It is very contributing in the detection of low-resolution features. It shows that the research method can reduce the loss value to 0.009 after 400 iterations of the loss curve test. The precision-recall (P-R) curve generated by the research method only starts to drop sharply when the Recall value reaches 0.96. The number of parameters generated by the research method is 3.46×10
6
. The detection accuracy of the research method reaches 98.86 % when there are five defective fault types. The results indicate that the proposed research method offers improved detection speed and higher accuracy in identifying hot spot defects in PV power stations. This technology provides valuable support for hot spot defect detection and presents new opportunities for the field. |
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| Bibliografie: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
| ISSN: | 2335-2124 2424-4635 |
| DOI: | 10.21595/jme.2023.23418 |