Kwon, M., Park, K., Baek, M., Hwang, S., Jang, T., & Park, B. (2019). Simulation Program with Integrated Circuit Emphasis Compact Modeling of a Dual-Gate Positive-Feedback Field-Effect Transistor for Circuit Simulations. Journal of nanoscience and nanotechnology, 19(10), 6417. https://doi.org/10.1166/jnn.2019.17069
Citace podle Chicago (17th ed.)Kwon, Min-Woo, Kyungchul Park, Myung-Hyun Baek, Sungmin Hwang, Tejin Jang, a Byung-Gook Park. "Simulation Program with Integrated Circuit Emphasis Compact Modeling of a Dual-Gate Positive-Feedback Field-Effect Transistor for Circuit Simulations." Journal of Nanoscience and Nanotechnology 19, no. 10 (2019): 6417. https://doi.org/10.1166/jnn.2019.17069.
Citace podle MLA (9th ed.)Kwon, Min-Woo, et al. "Simulation Program with Integrated Circuit Emphasis Compact Modeling of a Dual-Gate Positive-Feedback Field-Effect Transistor for Circuit Simulations." Journal of Nanoscience and Nanotechnology, vol. 19, no. 10, 2019, p. 6417, https://doi.org/10.1166/jnn.2019.17069.