Variations in Electric Switching and Transverse Resistance of GeTe/ Sb2Te3 Superlattices at Elevated Temperature Studied by Conductive Scanning Probe Microscopy

Temperature-dependent variations in electric switching and transverse resistance of phase-change [(GeTe) 2 (Sb 2 Te 3 )] n (n=4 and 8) chalcogenide superlattice (CSL) films were studied using conductive scanning probe microscopy (SPM). Three temperature regions with different electric transport prop...

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Vydané v:	MRS advances Ročník 3; číslo 5; s. 241 - 246
Hlavní autori:	Bolotov, Leonid, Saito, Yuta, Tada, Tetsuya, Tominaga, Junji
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	New York, USA Materials Research Society 2018 Springer International Publishing
Predmet:	Applied and Technical Physics Biomaterials Characterization and Evaluation of Materials Materials Engineering Materials Science Nanotechnology electrical properties scanning probe microscopy (SPM) phase transformation
ISSN:	2059-8521, 2059-8521
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