Zhang, B., Feng, C., Herrera, A., Chipounov, V., Candea, G., & Tang, C. (2018). Discover deeper bugs with dynamic symbolic execution and coverage-based fuzz testing. IET software, 12(6), 507-519. https://doi.org/10.1049/iet-sen.2017.0200
Chicago Style (17th ed.) CitationZhang, Bin, Chao Feng, Adrian Herrera, Vitaly Chipounov, George Candea, and Chaojing Tang. "Discover Deeper Bugs with Dynamic Symbolic Execution and Coverage-based Fuzz Testing." IET Software 12, no. 6 (2018): 507-519. https://doi.org/10.1049/iet-sen.2017.0200.
MLA (9th ed.) CitationZhang, Bin, et al. "Discover Deeper Bugs with Dynamic Symbolic Execution and Coverage-based Fuzz Testing." IET Software, vol. 12, no. 6, 2018, pp. 507-519, https://doi.org/10.1049/iet-sen.2017.0200.
Warning: These citations may not always be 100% accurate.