Zhang, B., Feng, C., Herrera, A., Chipounov, V., Candea, G., & Tang, C. (2018). Discover deeper bugs with dynamic symbolic execution and coverage-based fuzz testing. IET software, 12(6), 507-519. https://doi.org/10.1049/iet-sen.2017.0200
Chicago-Zitierstil (17. Ausg.)Zhang, Bin, Chao Feng, Adrian Herrera, Vitaly Chipounov, George Candea, und Chaojing Tang. "Discover Deeper Bugs with Dynamic Symbolic Execution and Coverage-based Fuzz Testing." IET Software 12, no. 6 (2018): 507-519. https://doi.org/10.1049/iet-sen.2017.0200.
MLA-Zitierstil (9. Ausg.)Zhang, Bin, et al. "Discover Deeper Bugs with Dynamic Symbolic Execution and Coverage-based Fuzz Testing." IET Software, vol. 12, no. 6, 2018, pp. 507-519, https://doi.org/10.1049/iet-sen.2017.0200.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.