Sadahiro, Y., & Liu, Y. (2020). A scale-sensitive approach for comparing and classifying point patterns. Journal of spatial science, 65(2), 281-306. https://doi.org/10.1080/14498596.2018.1492466
Chicago Style (17th ed.) CitationSadahiro, Yukio, and Yan Liu. "A Scale-sensitive Approach for Comparing and Classifying Point Patterns." Journal of Spatial Science 65, no. 2 (2020): 281-306. https://doi.org/10.1080/14498596.2018.1492466.
MLA (9th ed.) CitationSadahiro, Yukio, and Yan Liu. "A Scale-sensitive Approach for Comparing and Classifying Point Patterns." Journal of Spatial Science, vol. 65, no. 2, 2020, pp. 281-306, https://doi.org/10.1080/14498596.2018.1492466.
Warning: These citations may not always be 100% accurate.