A new method and computer-controlled system for measuring the time constant of real thermoelectric modules

► New method to precisely measure TE module and semiconductor parameters is developed. ► The new method is realized with a computer controlled apparatus called TEPAS. ► Fifteen different TE modules are studied with TEPAS, their parameters are obtained. ► The theoretic and experimental results valida...

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Vydáno v:Energy conversion and management Ročník 53; číslo 1; s. 314 - 321
Hlavní autoři: Ahiska, R., Dislitas, S., Omer, G.
Médium: Journal Article
Jazyk:angličtina
Vydáno: Kidlington Elsevier Ltd 2012
Elsevier
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ISSN:0196-8904, 1879-2227
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Abstract ► New method to precisely measure TE module and semiconductor parameters is developed. ► The new method is realized with a computer controlled apparatus called TEPAS. ► Fifteen different TE modules are studied with TEPAS, their parameters are obtained. ► The theoretic and experimental results validate the accuracy of new method and TEPAS. Thermoelectric and dynamic parameters of thermoelectric (TE) modules such as time constant are of crucial importance in production and utilization of these modules. Many techniques, apparatuses and software have been developed to determine the performance related parameters and time constants of TE modules; however, these techniques based on the assumption that the parameters of the semiconductors are constant or have time dependency only. Hence, the performance analyses of TE modules with these methods lack accuracy. In this study, Z, K, R and τ parameters of standard TE modules of Melcor Inc. have been acquired with a new computer controlled test system, Thermoelectric Performance Analysis System (TEPAS) which includes hardware and software based on the new method, variables of which are easily measurable temperature, current and voltage. The parameters Z, K, R and τ attained are compared with direct measurement results and the advantage of the new method and TEPAS have been demonstrated. Time constants of 15 different thermoelectric modules are calculated with the new method and three of them are attained with TEPAS. The results are compared with the other theoretical calculations and measurements available in literature. The system’s control and interface software was developed by Delphi visual programming language.
AbstractList Thermoelectric and dynamic parameters of thermoelectric (TE) modules such as time constant are of crucial importance in production and utilization of these modules. Many techniques, apparatuses and software have been developed to determine the performance related parameters and time constants of TE modules; however, these techniques based on the assumption that the parameters of the semiconductors are constant or have time dependency only. Hence, the performance analyses of TE modules with these methods lack accuracy. In this study, Z, K, R and τ parameters of standard TE modules of Melcor Inc. have been acquired with a new computer controlled test system, Thermoelectric Performance Analysis System (TEPAS) which includes hardware and software based on the new method, variables of which are easily measurable temperature, current and voltage. The parameters Z, K, R and τ attained are compared with direct measurement results and the advantage of the new method and TEPAS have been demonstrated. Time constants of 15 different thermoelectric modules are calculated with the new method and three of them are attained with TEPAS. The results are compared with the other theoretical calculations and measurements available in literature. The system’s control and interface software was developed by Delphi visual programming language.
► New method to precisely measure TE module and semiconductor parameters is developed. ► The new method is realized with a computer controlled apparatus called TEPAS. ► Fifteen different TE modules are studied with TEPAS, their parameters are obtained. ► The theoretic and experimental results validate the accuracy of new method and TEPAS. Thermoelectric and dynamic parameters of thermoelectric (TE) modules such as time constant are of crucial importance in production and utilization of these modules. Many techniques, apparatuses and software have been developed to determine the performance related parameters and time constants of TE modules; however, these techniques based on the assumption that the parameters of the semiconductors are constant or have time dependency only. Hence, the performance analyses of TE modules with these methods lack accuracy. In this study, Z, K, R and τ parameters of standard TE modules of Melcor Inc. have been acquired with a new computer controlled test system, Thermoelectric Performance Analysis System (TEPAS) which includes hardware and software based on the new method, variables of which are easily measurable temperature, current and voltage. The parameters Z, K, R and τ attained are compared with direct measurement results and the advantage of the new method and TEPAS have been demonstrated. Time constants of 15 different thermoelectric modules are calculated with the new method and three of them are attained with TEPAS. The results are compared with the other theoretical calculations and measurements available in literature. The system’s control and interface software was developed by Delphi visual programming language.
Author Dislitas, S.
Omer, G.
Ahiska, R.
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  surname: Omer
  fullname: Omer, G.
  organization: Ankara University, The Graduate School of Natural and Applied Sciences, Department of Physics, Ankara, Turkey
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Cites_doi 10.1016/S0017-9310(02)00217-X
10.1063/1.1723445
10.1007/BF00851790
10.1016/j.enconman.2010.06.023
10.1016/S0196-8904(02)00062-6
10.1134/S1063782607010204
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Issue 1
Keywords Measurement
Real thermoelectric module
Computer controlled systems
Thermoelectric testing algorithm
Time constant
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Snippet ► New method to precisely measure TE module and semiconductor parameters is developed. ► The new method is realized with a computer controlled apparatus called...
Thermoelectric and dynamic parameters of thermoelectric (TE) modules such as time constant are of crucial importance in production and utilization of these...
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SubjectTerms Applied sciences
Computer controlled systems
computer software
Energy
Exact sciences and technology
Measurement
methodology
Real thermoelectric module
semiconductors
temperature
Thermoelectric testing algorithm
Time constant
Title A new method and computer-controlled system for measuring the time constant of real thermoelectric modules
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