Nag, S., Makwana, D., R, S. C. T., Mittal, S., & Mohan, C. (2022). WaferSegClassNet - A light-weight network for classification and segmentation of semiconductor wafer defects. Computers in industry, 142, 103720. https://doi.org/10.1016/j.compind.2022.103720
Citace podle Chicago (17th ed.)Nag, Subhrajit, Dhruv Makwana, Sai Chandra Teja R, Sparsh Mittal, a C.Krishna Mohan. "WaferSegClassNet - A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects." Computers in Industry 142 (2022): 103720. https://doi.org/10.1016/j.compind.2022.103720.
Citace podle MLA (9th ed.)Nag, Subhrajit, et al. "WaferSegClassNet - A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects." Computers in Industry, vol. 142, 2022, p. 103720, https://doi.org/10.1016/j.compind.2022.103720.