Microprocessor-Based System for Measuring the Modulus and Components of the Complex Resistance of a Two-Terminal Element in a Multiterminal Electrical Circuit

We propose a microprocessor-based measurement system (MBMS) for measuring the modulus and components of the complex resistance of an individual two-terminal element and the complex resistance of a two-terminal element in a branch of a multiterminal electrical circuit (MTEC) of T type or H type with...

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Bibliographic Details
Published in:Measurement techniques Vol. 59; no. 11; pp. 1191 - 1196
Main Authors: Sharonov, G. I., Nefed’ev, A. I.
Format: Journal Article
Language:English
Published: New York Springer US 01.02.2017
Springer
Springer Nature B.V
Subjects:
Analytical Chemistry
Block diagrams
Characterization and Evaluation of Materials
Circuits
CPUs (Central processing units)
Electric circuits
Electromagnetic Measurements
Joints
Measurement
Measurement Science and Instrumentation
Measurement techniques
Measuring instruments
Microprocessors
Physical Chemistry
Physics
Physics and Astronomy
microprocessor-based control unit (MBCU)
complex resistance of two-terminal element (CRTTE)
algorithmic measurement method
microprocessor-based measurement system (MBMS)
multiterminal electrical circuit (MTEC)
ISSN:0543-1972, 1573-8906
Online Access:Get full text
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Summary:We propose a microprocessor-based measurement system (MBMS) for measuring the modulus and components of the complex resistance of an individual two-terminal element and the complex resistance of a two-terminal element in a branch of a multiterminal electrical circuit (MTEC) of T type or H type with one and with two points that are inaccessible for connection of the complex resistance of the two-terminal element (CRTTE). We present the block diagram for the microprocessor-based measurement system and results of the study.
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ISSN:0543-1972
1573-8906
DOI:10.1007/s11018-017-1114-6