Microprocessor-Based System for Measuring the Modulus and Components of the Complex Resistance of a Two-Terminal Element in a Multiterminal Electrical Circuit

We propose a microprocessor-based measurement system (MBMS) for measuring the modulus and components of the complex resistance of an individual two-terminal element and the complex resistance of a two-terminal element in a branch of a multiterminal electrical circuit (MTEC) of T type or H type with...

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Vydáno v:	Measurement techniques Ročník 59; číslo 11; s. 1191 - 1196
Hlavní autoři:	Sharonov, G. I., Nefed’ev, A. I.
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York Springer US 01.02.2017 Springer Springer Nature B.V
Témata:	Analytical Chemistry Block diagrams Characterization and Evaluation of Materials Circuits CPUs (Central processing units) Electric circuits Electromagnetic Measurements Joints Measurement Measurement Science and Instrumentation Measurement techniques Measuring instruments Microprocessors Physical Chemistry Physics Physics and Astronomy microprocessor-based control unit (MBCU) complex resistance of two-terminal element (CRTTE) algorithmic measurement method microprocessor-based measurement system (MBMS) multiterminal electrical circuit (MTEC)
ISSN:	0543-1972, 1573-8906
On-line přístup:	Získat plný text
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