Jung, D., & Sundstrom, C. (2019). A Combined Data-Driven and Model-Based Residual Selection Algorithm for Fault Detection and Isolation. IEEE transactions on control systems technology, 27(2), 616-630. https://doi.org/10.1109/TCST.2017.2773514
Citácia podle Chicago (17th ed.)Jung, Daniel, a Christofer Sundstrom. "A Combined Data-Driven and Model-Based Residual Selection Algorithm for Fault Detection and Isolation." IEEE Transactions on Control Systems Technology 27, no. 2 (2019): 616-630. https://doi.org/10.1109/TCST.2017.2773514.
Citácia podľa MLA (8th ed.)Jung, Daniel, a Christofer Sundstrom. "A Combined Data-Driven and Model-Based Residual Selection Algorithm for Fault Detection and Isolation." IEEE Transactions on Control Systems Technology, vol. 27, no. 2, 2019, pp. 616-630, https://doi.org/10.1109/TCST.2017.2773514.