Zhengtian, Z., Zhiyuan, R., & Xiaoyan, D. (2023). Feature selection for binary classification based on class labeling, SOM, and hierarchical clustering. Measurement and control (London), 56(9-10), 1649-1669. https://doi.org/10.1177/00202940231173748
Chicago-Zitierstil (17. Ausg.)Zhengtian, Zhao, Rui Zhiyuan, und Duan Xiaoyan. "Feature Selection for Binary Classification Based on Class Labeling, SOM, and Hierarchical Clustering." Measurement and Control (London) 56, no. 9-10 (2023): 1649-1669. https://doi.org/10.1177/00202940231173748.
MLA-Zitierstil (9. Ausg.)Zhengtian, Zhao, et al. "Feature Selection for Binary Classification Based on Class Labeling, SOM, and Hierarchical Clustering." Measurement and Control (London), vol. 56, no. 9-10, 2023, pp. 1649-1669, https://doi.org/10.1177/00202940231173748.