APA (7th ed.) Citation

Zhengtian, Z., Zhiyuan, R., & Xiaoyan, D. (2023). Feature selection for binary classification based on class labeling, SOM, and hierarchical clustering. Measurement and control (London), 56(9-10), 1649-1669. https://doi.org/10.1177/00202940231173748

Chicago Style (17th ed.) Citation

Zhengtian, Zhao, Rui Zhiyuan, and Duan Xiaoyan. "Feature Selection for Binary Classification Based on Class Labeling, SOM, and Hierarchical Clustering." Measurement and Control (London) 56, no. 9-10 (2023): 1649-1669. https://doi.org/10.1177/00202940231173748.

MLA (9th ed.) Citation

Zhengtian, Zhao, et al. "Feature Selection for Binary Classification Based on Class Labeling, SOM, and Hierarchical Clustering." Measurement and Control (London), vol. 56, no. 9-10, 2023, pp. 1649-1669, https://doi.org/10.1177/00202940231173748.