Intergrowth of Components and Ramps in Coffin-Shaped ZSM-5 Zeolite Crystals Unraveled by Focused Ion Beam-Assisted Transmission Electron Microscopy

Scanning electron microscopy, focused ion beam (FIB), and transmission electron microscopy are combined to study the intergrowth of 90° rotational components and of ramps in coffin-shaped ZSM-5 crystals. The 90° rotational boundaries with local zig-zag features between different intergrowth componen...

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Bibliographic Details

Published in:	Microscopy and microanalysis Vol. 20; no. 1; pp. 42 - 49
Main Authors:	Lu, Jiangbo, Roeffaers, Maarten B.J., Bartholomeeusen, Evelyne, Sels, Bert F., Schryvers, Dominique
Format:	Journal Article
Language:	English
Published:	New York, USA Cambridge University Press 01.02.2014 Oxford University Press
Subjects:	Catalytic cracking Crystals Ion beams Materials Applications Scanning electron microscopy Transmission electron microscopy Zeolites rotational boundary zeolite focused ion beam ZSM-5 displacement boundary intergrowth transmission electron microscopy
ISSN:	1431-9276, 1435-8115, 1435-8115
Online Access:	Get full text
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