Elucidating the resistance to failure under tribological tests of various boron-based films by XPS and ToF-SIMS

[Display omitted] •Boron-based thermal films were grown in the presence of ZnDTP.•Thermal films and glasses were characterized by ToF-SIMS.•Effects of tribological tests on ball-disc sliding pairs were determined.•Mechanisms for both tribochemical and tribomechanical reactions have been proposed.•Th...

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Vydáno v:	Applied surface science Ročník 425; s. 948 - 964
Hlavní autoři:	Spadaro, F., Rossi, A., Lainé, E., Woodward, P., Spencer, N.D.
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	Elsevier B.V 15.12.2017
Témata:	Boron-based thermal film Boron-free thermal film Imaging ToF-SIMS Mass spectra Small-area XPS Tribomechanical reactions Boron-based thermal film Imaging ToF-SIMS Boron-free thermal film Tribomechanical reactions Mass spectra Small-area XPS
ISSN:	0169-4332, 1873-5584
On-line přístup:	Získat plný text
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