Cui, J., Liu, H., Li, X., Jiang, S., Zhang, B., Song, Y., & Zhang, W. (2020). Fabrication and characterization of nickel thin film as resistance temperature detector. Vacuum, 176, 109288. https://doi.org/10.1016/j.vacuum.2020.109288
Chicago-Zitierstil (17. Ausg.)Cui, Jinting, Hao Liu, Xingliang Li, Shuwen Jiang, Bin Zhang, Ying Song, und Wanli Zhang. "Fabrication and Characterization of Nickel Thin Film as Resistance Temperature Detector." Vacuum 176 (2020): 109288. https://doi.org/10.1016/j.vacuum.2020.109288.
MLA-Zitierstil (9. Ausg.)Cui, Jinting, et al. "Fabrication and Characterization of Nickel Thin Film as Resistance Temperature Detector." Vacuum, vol. 176, 2020, p. 109288, https://doi.org/10.1016/j.vacuum.2020.109288.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.