Cui, J., Liu, H., Li, X., Jiang, S., Zhang, B., Song, Y., & Zhang, W. (2020). Fabrication and characterization of nickel thin film as resistance temperature detector. Vacuum, 176, 109288. https://doi.org/10.1016/j.vacuum.2020.109288
Citace podle Chicago (17th ed.)Cui, Jinting, Hao Liu, Xingliang Li, Shuwen Jiang, Bin Zhang, Ying Song, a Wanli Zhang. "Fabrication and Characterization of Nickel Thin Film as Resistance Temperature Detector." Vacuum 176 (2020): 109288. https://doi.org/10.1016/j.vacuum.2020.109288.
Citace podle MLA (9th ed.)Cui, Jinting, et al. "Fabrication and Characterization of Nickel Thin Film as Resistance Temperature Detector." Vacuum, vol. 176, 2020, p. 109288, https://doi.org/10.1016/j.vacuum.2020.109288.
Upozornění: Tyto citace jsou generovány automaticky. Nemusí být zcela správně podle citačních pravidel..