Qiu, W., Rudkin, S., & Dłotko, P. (2020). Refining understanding of corporate failure through a topological data analysis mapping of Altman’s Z-score model. Expert systems with applications, 156, 113475. https://doi.org/10.1016/j.eswa.2020.113475
Citace podle Chicago (17th ed.)Qiu, Wanling, Simon Rudkin, a Paweł Dłotko. "Refining Understanding of Corporate Failure Through a Topological Data Analysis Mapping of Altman’s Z-score Model." Expert Systems with Applications 156 (2020): 113475. https://doi.org/10.1016/j.eswa.2020.113475.
Citace podle MLA (9th ed.)Qiu, Wanling, et al. "Refining Understanding of Corporate Failure Through a Topological Data Analysis Mapping of Altman’s Z-score Model." Expert Systems with Applications, vol. 156, 2020, p. 113475, https://doi.org/10.1016/j.eswa.2020.113475.