Cone-beam CT reconstruction for planar object

All traditional CT reconstruction algorithms define the reconstruction slices as perpendicular to the axis of rotation. This leads to a significant inefficiency when reconstructing and visualizing multilayered planar objects such as stacked IC and MEMS devices. This paper reports an alternative solu...

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Vydané v:	NDT & E international : independent nondestructive testing and evaluation Ročník 45; číslo 1; s. 9 - 15
Hlavný autor:	Liu, Tong
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Kidlington Elsevier Ltd 2012 Elsevier
Predmet:	Algorithms Applied sciences Artificial intelligence Computed tomography Computer science; control theory; systems Cone-beam CT Error analysis Exact sciences and technology Image rotation Instruments, apparatus, components and techniques common to several branches of physics and astronomy Interpolation Mathematical analysis Mathematical models Nondestructive testing Pattern recognition. Digital image processing. Computational geometry Physics Planar object Reconstruction X- and γ-ray instruments and techniques Computed tomography Cone-beam CT Planar object Visualization Image processing Layered materials Orientation Image reconstruction Computerized tomography Cones Modelling Analytical solution Microelectromechanical device Planar technology
ISSN:	0963-8695, 1879-1174
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