Bayar, N., Darmoul, S., Hajri-Gabouj, S., & Pierreval, H. (2016). Using immune designed ontologies to monitor disruptions in manufacturing systems. Computers in industry, 81, 67-81. https://doi.org/10.1016/j.compind.2015.09.004
Citácia podle Chicago (17th ed.)Bayar, Nawel, Saber Darmoul, Sonia Hajri-Gabouj, a Henri Pierreval. "Using Immune Designed Ontologies to Monitor Disruptions in Manufacturing Systems." Computers in Industry 81 (2016): 67-81. https://doi.org/10.1016/j.compind.2015.09.004.
Citácia podľa MLA (8th ed.)Bayar, Nawel, et al. "Using Immune Designed Ontologies to Monitor Disruptions in Manufacturing Systems." Computers in Industry, vol. 81, 2016, pp. 67-81, https://doi.org/10.1016/j.compind.2015.09.004.
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