Analysis and Implementation of a Direct Phase Unwrapping Method for Displacement Measurement Using Self-Mixing Interferometry

Self-mixing or optical feedback interferometry has been widely used for displacement and velocity measurement applications. For metric information retrieval with <; λ/2 precision, various phase unwrapping methods have been proposed. However, these are computationally heavy and require large numbe...

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Veröffentlicht in:IEEE sensors journal Jg. 17; H. 22; S. 7425 - 7432
Hauptverfasser: Ehtesham, Ayesha, Zabit, Usman, Bernal, Olivier D., Raja, Gulistan, Bosch, Thierry
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York IEEE 15.11.2017
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
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ISSN:1530-437X, 1558-1748
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Abstract Self-mixing or optical feedback interferometry has been widely used for displacement and velocity measurement applications. For metric information retrieval with <; λ/2 precision, various phase unwrapping methods have been proposed. However, these are computationally heavy and require large number of hardware resources, thereby hindering the development of real-time, embedded solutions for large bandwidth applications. In this regard, a simple and efficient feedback phase retrieval algorithm, called consecutive samples-based unwrapping (CSU) is presented. Detailed analysis of its error performance has been conducted as a function of key optical feedback parameters. A theoretical study has also been conducted to explain as to why such good error performance is obtained for such a simple algorithm by establishing a linear relation between the modulated laser power signal and the laser phase in the absence of optical feedback for specific ranges of key optical feedback parameters. We applied CSU on various simulated and experimentally acquired signals using SMI for the retrieval of harmonic and arbitrary displacements and found out that CSU retrieves target displacement with a precision of about λ/10 while consuming much less time and hardware resources. The paper also presents FPGA based hardware design results of CSU and compares its performance with a traditional analytical phase unwrapping method in terms of maximum clock frequency, latency, and on-chip hardware resources. This hardware comparison strongly establishes the advantages of such a fast and computationally light algorithm, readily suitable for large bandwidth, embedded, and real-time sensing applications.
AbstractList Self-mixing or optical feedback interferometry has been widely used for displacement and velocity measurement applications. For metric information retrieval with <; λ/2 precision, various phase unwrapping methods have been proposed. However, these are computationally heavy and require large number of hardware resources, thereby hindering the development of real-time, embedded solutions for large bandwidth applications. In this regard, a simple and efficient feedback phase retrieval algorithm, called consecutive samples-based unwrapping (CSU) is presented. Detailed analysis of its error performance has been conducted as a function of key optical feedback parameters. A theoretical study has also been conducted to explain as to why such good error performance is obtained for such a simple algorithm by establishing a linear relation between the modulated laser power signal and the laser phase in the absence of optical feedback for specific ranges of key optical feedback parameters. We applied CSU on various simulated and experimentally acquired signals using SMI for the retrieval of harmonic and arbitrary displacements and found out that CSU retrieves target displacement with a precision of about λ/10 while consuming much less time and hardware resources. The paper also presents FPGA based hardware design results of CSU and compares its performance with a traditional analytical phase unwrapping method in terms of maximum clock frequency, latency, and on-chip hardware resources. This hardware comparison strongly establishes the advantages of such a fast and computationally light algorithm, readily suitable for large bandwidth, embedded, and real-time sensing applications.
Self-Mixing (SM) or optical feedback interferometry has been widely used for displacement and velocity measurement applications. For metric information retrieval with < λ/2 precision, various phase unwrapping methods have been proposed. However, these are computationally heavyand require large number of hardware resources, thereby hindering the development of real-time, embedded solutions for large bandwidth applications. In this regard, a simple and efficient feedback phase retrieval algorithm, called Consecutive Samples based Unwrapping (CSU) is presented. Detailed analysis of its error performance has been conducted as a function of key optical feedback parameters. A theoretical study has also been conducted to explain as to why such good error performance is obtained for such a simple algorithm by establishing a linearrelation between the modulated laser power signal and the laser phase in the absence of optical feedback for specific ranges of key optical feedback parameters. We applied CSU on various simulated and experimentally acquired signals using SMI for the retrieval of harmonic and arbitrary displacements and found out that CSU retrieves target displacement with a precision of about λ/10 while consuming much less time and hardware resources. The paper also presents FPGA based hardware design results of CSU and compares its performance with a traditional analytical phase unwrapping method in terms of maximum clock frequency, latency, and on-chip hardware resources. This hardware comparison strongly establishes the advantages of such a fast and computationally light algorithm, readily suitable for large bandwidth, embedded, real-time sensing applications.
Self-mixing or optical feedback interferometry has been widely used for displacement and velocity measurement applications. For metric information retrieval with [Formula Omitted] precision, various phase unwrapping methods have been proposed. However, these are computationally heavy and require large number of hardware resources, thereby hindering the development of real-time, embedded solutions for large bandwidth applications. In this regard, a simple and efficient feedback phase retrieval algorithm, called consecutive samples-based unwrapping (CSU) is presented. Detailed analysis of its error performance has been conducted as a function of key optical feedback parameters. A theoretical study has also been conducted to explain as to why such good error performance is obtained for such a simple algorithm by establishing a linear relation between the modulated laser power signal and the laser phase in the absence of optical feedback for specific ranges of key optical feedback parameters. We applied CSU on various simulated and experimentally acquired signals using SMI for the retrieval of harmonic and arbitrary displacements and found out that CSU retrieves target displacement with a precision of about [Formula Omitted] while consuming much less time and hardware resources. The paper also presents FPGA based hardware design results of CSU and compares its performance with a traditional analytical phase unwrapping method in terms of maximum clock frequency, latency, and on-chip hardware resources. This hardware comparison strongly establishes the advantages of such a fast and computationally light algorithm, readily suitable for large bandwidth, embedded, and real-time sensing applications.
Author Ehtesham, Ayesha
Raja, Gulistan
Bernal, Olivier D.
Zabit, Usman
Bosch, Thierry
Author_xml – sequence: 1
  givenname: Ayesha
  surname: Ehtesham
  fullname: Ehtesham, Ayesha
  organization: Dept. of Electr. Eng., Univ. of Eng. & Technol., Taxila, Pakistan
– sequence: 2
  givenname: Usman
  surname: Zabit
  fullname: Zabit, Usman
  email: usman.zabit@seecs.nust.edu.pk
  organization: Dept. of Electr. Eng., Nat. Univ. of Sci. & Technol., Islamabad, Pakistan
– sequence: 3
  givenname: Olivier D.
  surname: Bernal
  fullname: Bernal, Olivier D.
  organization: LAAS, Univ. de Toulouse, Toulouse, France
– sequence: 4
  givenname: Gulistan
  surname: Raja
  fullname: Raja, Gulistan
  email: gulistan.raja@uettaxila.edu.pk
  organization: Dept. of Electron. Eng., Univ. of Eng. & Technol., Taxila, Pakistan
– sequence: 5
  givenname: Thierry
  surname: Bosch
  fullname: Bosch, Thierry
  email: thierry.bosch@enseeiht.fr
  organization: LAAS, Univ. de Toulouse, Toulouse, France
BackLink https://hal.science/hal-01617743$$DView record in HAL
BookMark eNp9kU9v1DAQxS1UJNrCB0BcLHHikMWO7dg5rkr_LNoCUlmJm-V1xqyrrB1sL3QPfHcSUjhw4DJ-Gv3eaDzvDJ2EGAChl5QsKCXt2_d3lx8WNaFyUUuhOCdP0CkVQlVUcnUyaUYqzuSXZ-gs53tCaCuFPEU_l8H0x-wzNqHDq_3Qwx5CMcXHgKPDBr_zCWzBn3YmA96EH8kMgw9f8S2UXeywi2lE8tAb-9s59k0-pFlv8kTeQe-qW_8w6VUokBykuIeSjs_RU2f6DC8e33O0ubr8fHFTrT9ery6W68oySUplW-pkx8fSNEp2YFXHTTt-gKq6FW4LwmyZI1Y5u1VMkdqSlvOOO-CghDLsHL2Z5-5Mr4fk9yYddTRe3yzXeuoR2lApOftOR_b1zA4pfjtALvo-HtJ4paxpKxpes0a2IyVnyqaYcwKnrZ-vVpLxvaZET7noKRc95aIfcxmd9B_nn4X-53k1ezwA_OUVEUIwxX4B6UmcGQ
CODEN ISJEAZ
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Cites_doi 10.1109/JSEN.2013.2251626
10.1109/JSEN.2009.2031496
10.1109/TIM.2006.876544
10.1109/JQE.2012.2211862
10.1109/I2MTC.2012.6229702
10.1109/JSEN.2011.2131646
10.1364/AOP.7.000570
10.1364/AO.53.001001
10.1364/AO.53.000702
10.1002/lpor.201100002
10.1088/0957-0233/14/1/304
10.1109/TIM.2016.2626018
10.1109/LPT.2008.926569
10.1117/1.OE.55.7.074107
10.1016/j.optlastec.2014.04.004
10.1109/JSEN.2013.2266931
10.1109/JSEN.2015.2478755
10.1364/AO.51.005318
10.1109/JSTQE.2014.2381494
10.1109/JQE.2005.853364
10.1109/JSEN.2016.2599702
10.1109/JSEN.2013.2276106
10.1109/3.563379
10.1109/TIM.2007.904551
10.1109/JQE.2009.2013153
10.1109/IMTC.2011.5944179
10.1109/JQE.1980.1070479
10.1109/JQE.2013.2273562
10.1109/ICSENS.2012.6411122
10.1109/JQE.2005.851250
10.1364/AO.50.005064
10.1109/LPT.2010.2040825
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017
Distributed under a Creative Commons Attribution 4.0 International License
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017
– notice: Distributed under a Creative Commons Attribution 4.0 International License
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
7U5
8FD
L7M
1XC
VOOES
DOI 10.1109/JSEN.2017.2758440
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Hyper Article en Ligne (HAL)
Hyper Article en Ligne (HAL) (Open Access)
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList

Solid State and Superconductivity Abstracts
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Geography
Engineering
EISSN 1558-1748
EndPage 7432
ExternalDocumentID oai:HAL:hal-01617743v1
10_1109_JSEN_2017_2758440
8055538
Genre orig-research
GroupedDBID -~X
0R~
29I
4.4
5GY
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AGQYO
AHBIQ
AJQPL
AKJIK
AKQYR
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
EBS
EJD
F5P
HZ~
IFIPE
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
TWZ
AAYXX
CITATION
7SP
7U5
8FD
L7M
RIG
1XC
VOOES
ID FETCH-LOGICAL-c370t-c91f7d41f76687dec8d4a997518295fbe5ab3f0c8fcb83802c0944d4fe4e858a3
IEDL.DBID RIE
ISICitedReferencesCount 45
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000413948300026&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1530-437X
IngestDate Sat Oct 25 06:46:12 EDT 2025
Mon Jun 30 10:18:04 EDT 2025
Sat Nov 29 05:42:43 EST 2025
Tue Nov 18 22:06:28 EST 2025
Wed Aug 27 03:06:21 EDT 2025
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 22
Keywords Phase Unwrapping
Self-Mixing
Displacement Measurement
Optical Feedback Interferometry
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
Distributed under a Creative Commons Attribution 4.0 International License: http://creativecommons.org/licenses/by/4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c370t-c91f7d41f76687dec8d4a997518295fbe5ab3f0c8fcb83802c0944d4fe4e858a3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0002-6744-7371
0000-0003-2026-1219
0000-0003-4016-0634
0000-0002-8889-0620
OpenAccessLink https://hal.science/hal-01617743
PQID 1956423679
PQPubID 75733
PageCount 8
ParticipantIDs hal_primary_oai_HAL_hal_01617743v1
proquest_journals_1956423679
ieee_primary_8055538
crossref_citationtrail_10_1109_JSEN_2017_2758440
crossref_primary_10_1109_JSEN_2017_2758440
PublicationCentury 2000
PublicationDate 2017-11-15
PublicationDateYYYYMMDD 2017-11-15
PublicationDate_xml – month: 11
  year: 2017
  text: 2017-11-15
  day: 15
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE sensors journal
PublicationTitleAbbrev JSEN
PublicationYear 2017
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
– name: Institute of Electrical and Electronics Engineers
References ref13
ref12
ref15
ref14
ref31
ref30
ref11
ref32
ref10
ref2
ref1
ref17
ref16
ref19
ref18
ref24
ref23
ref26
ref25
ref20
ref22
ref21
ref28
ref27
ref29
ref8
ref7
ref9
ref4
ref3
ref6
ref5
References_xml – ident: ref5
  doi: 10.1109/JSEN.2013.2251626
– ident: ref12
  doi: 10.1109/JSEN.2009.2031496
– ident: ref14
  doi: 10.1109/TIM.2006.876544
– ident: ref17
  doi: 10.1109/JQE.2012.2211862
– ident: ref20
  doi: 10.1109/I2MTC.2012.6229702
– ident: ref4
  doi: 10.1109/JSEN.2011.2131646
– ident: ref1
  doi: 10.1364/AOP.7.000570
– ident: ref25
  doi: 10.1364/AO.53.001001
– ident: ref30
  doi: 10.1364/AO.53.000702
– ident: ref2
  doi: 10.1002/lpor.201100002
– ident: ref8
  doi: 10.1088/0957-0233/14/1/304
– ident: ref9
  doi: 10.1109/TIM.2016.2626018
– ident: ref19
  doi: 10.1109/LPT.2008.926569
– ident: ref28
  doi: 10.1117/1.OE.55.7.074107
– ident: ref32
  doi: 10.1016/j.optlastec.2014.04.004
– ident: ref7
  doi: 10.1109/JSEN.2013.2266931
– ident: ref11
  doi: 10.1109/JSEN.2015.2478755
– ident: ref27
  doi: 10.1364/AO.51.005318
– ident: ref21
  doi: 10.1109/JSTQE.2014.2381494
– ident: ref29
  doi: 10.1109/JQE.2005.853364
– ident: ref10
  doi: 10.1109/JSEN.2016.2599702
– ident: ref16
  doi: 10.1109/JSEN.2013.2276106
– ident: ref13
  doi: 10.1109/3.563379
– ident: ref3
  doi: 10.1109/TIM.2007.904551
– ident: ref31
  doi: 10.1109/JQE.2009.2013153
– ident: ref22
  doi: 10.1109/IMTC.2011.5944179
– ident: ref24
  doi: 10.1109/JQE.1980.1070479
– ident: ref6
  doi: 10.1109/JQE.2013.2273562
– ident: ref23
  doi: 10.1109/ICSENS.2012.6411122
– ident: ref26
  doi: 10.1109/JQE.2005.851250
– ident: ref15
  doi: 10.1364/AO.50.005064
– ident: ref18
  doi: 10.1109/LPT.2010.2040825
SSID ssj0019757
Score 2.3929348
Snippet Self-mixing or optical feedback interferometry has been widely used for displacement and velocity measurement applications. For metric information retrieval...
Self-Mixing (SM) or optical feedback interferometry has been widely used for displacement and velocity measurement applications. For metric information...
SourceID hal
proquest
crossref
ieee
SourceType Open Access Repository
Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 7425
SubjectTerms Algorithms
Bandwidths
Computer simulation
Displacement measurement
Electronics
Engineering Sciences
Error analysis
Hardware
Information retrieval
Interferometry
Laser feedback
Laser modes
Optical feedback
optical feedback interferometry
Optical interferometry
Optics
Phase retrieval
Phase unwrapping
Photonic
Real time
Real-time systems
self-mixing
Sensors
Velocity measurement
Title Analysis and Implementation of a Direct Phase Unwrapping Method for Displacement Measurement Using Self-Mixing Interferometry
URI https://ieeexplore.ieee.org/document/8055538
https://www.proquest.com/docview/1956423679
https://hal.science/hal-01617743
Volume 17
WOSCitedRecordID wos000413948300026&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-1748
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0019757
  issn: 1530-437X
  databaseCode: RIE
  dateStart: 20010101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1RaxQxEB56RVAfqrZKz1YJ4pO4bfaS2ySPRVqKtEehFu5tySYTrlD3yt212gf_u5lsbikogi9LWGYg8CWZSWbmG4CPclT60mJVBK5MQZG9wqKsCsvRq6CFDl2h8JmaTPR0ai424HNfC4OIKfkMD2iYYvl-7u7oqexQEzuV0AMYKFV1tVp9xMCoxOoZNzAvpFDTHMEsuTn8enk8oSQudTCK3rGkd45HNmgwowzI1Frlj_M4GZmTF_83vZewlZ1JdtSh_wo2sN2G548oBrfhae5yPnvYgV9rBhJmW88SL_D3XHrUsnlglnUHILuYRdvGrtofUZHqqdh56jPNooMbRZYpj4s04__-hZGl5AN2iTehOL_-SeP02hiQCBFWi4fXcHVy_O3LaZHbLxROKL4qnCmD8jJ-qkorj057aY2hOM3IjEODY9uIwJ0Oromg8pGLV0XpZUCJeqyteAOb7bzFXWDRBla2QdME76VqhA0uOkLYeOEsF2iHwNeA1C5zk1OLjJs63VG4qQnDmjCsM4ZD-NSr3HbEHP8S_hBR7uWIUvv06Kymf-TyRhdY3JdD2CFMe6kM5xD214uizvt7WVOVpSTyO_P271p78IwmQFWL5XgfNleLO3wHT9z96nq5eJ-W7m-EWu1R
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3faxQxEB7aKlQf_NEqPa0axCdx2-wld0kei7ScencU2sK9LdlkwhXqXrm7Vvvg_24ml1sKiuDLEpYZCHxJZpKZ-Qbgg-yWvrTYLwJXpqDIXmFR9gvL0aughQ6rQuGhGo_1ZGJON-BTWwuDiCn5DA9omGL5fuZu6KnsUBM7ldCb8IA6Z-VqrTZmYFTi9YxbmBdSqEmOYZbcHH49Ox5TGpc66Eb_WNJLxz0rtDmlHMjUXOWPEzmZmZOn_zfBZ_Aku5PsaIX_c9jAZgce3yMZ3IHt3Od8ercLv9YcJMw2niVm4O-5-Khhs8AsWx2B7HQarRu7aH5ERaqoYqPUaZpFFzeKLFImF2nG_-0bI0vpB-wMr0IxuvxJ4_TeGJAoEZbzuxdwcXJ8_nlQ5AYMhROKLwtnyqC8jJ9-XyuPTntpjaFITdf0Qo09W4vAnQ6ujrDyrouXRellQIm6p614CVvNrME9YNEK9m2Npg7eS1ULG1x0hbD2wlku0HaArwGpXGYnpyYZV1W6pXBTEYYVYVhlDDvwsVW5XlFz_Ev4fUS5lSNS7cHRsKJ_5PRGJ1jclh3YJUxbqQxnB_bXi6LKO3xRUZ2lJPo78-rvWu9ge3A-GlbDL-Nvr-ERTYZqGMvePmwt5zf4Bh662-XlYv42LePfAovwmg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Analysis+and+Implementation+of+a+Direct+Phase+Unwrapping+Method+for+Displacement+Measurement+using+Self-Mixing+Interferometry&rft.jtitle=IEEE+sensors+journal&rft.au=Ehtesham%2C+Ayesha&rft.au=Zabit%2C+Usman&rft.au=Bernal%2C+Olivier&rft.au=Raja%2C+Gulistan&rft.date=2017-11-15&rft.pub=Institute+of+Electrical+and+Electronics+Engineers&rft.issn=1530-437X&rft.volume=17&rft.issue=22&rft_id=info:doi/10.1109%2FJSEN.2017.2758440&rft.externalDBID=HAS_PDF_LINK&rft.externalDocID=oai%3AHAL%3Ahal-01617743v1
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1530-437X&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1530-437X&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1530-437X&client=summon