Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes

One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being ph...

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Veröffentlicht in:	IEEE transactions on control systems technology Jg. 29; H. 5; S. 2264 - 2270
Hauptverfasser:	Lagrange, Denis, Mauran, Nicolas, Schwab, Lucien, Legrand, Bernard
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York IEEE 01.09.2021 The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Schlagworte:	Actuation Amplitude and phase demodulation Atomic force microscopy atomic force microscopy (AFM) Bandwidth Carrier frequencies Demodulation Electronics Engineering Sciences Field programmable gate arrays field-programmable gate array~(FPGA) implementation Lock in amplifiers Micro and nanotechnologies Microelectronics Microscopes Microscopy Signal and Image processing Sine waves low latency amplitude and phase demodulation field-programmable gate array (FPGA) implementations atomic force microscopy
ISSN:	1063-6536, 1558-0865
Online-Zugang:	Volltext
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