Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes

One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being ph...

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Published in:	IEEE transactions on control systems technology Vol. 29; no. 5; pp. 2264 - 2270
Main Authors:	Lagrange, Denis, Mauran, Nicolas, Schwab, Lucien, Legrand, Bernard
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.09.2021 The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Subjects:	Actuation Amplitude and phase demodulation Atomic force microscopy atomic force microscopy (AFM) Bandwidth Carrier frequencies Demodulation Electronics Engineering Sciences Field programmable gate arrays field-programmable gate array~(FPGA) implementation Lock in amplifiers Micro and nanotechnologies Microelectronics Microscopes Microscopy Signal and Image processing Sine waves low latency amplitude and phase demodulation field-programmable gate array (FPGA) implementations atomic force microscopy
ISSN:	1063-6536, 1558-0865
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Abstract	One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being phase-locked on the probe actuation. The method is implemented on a RedPitaya platform, with its clock being generated from the actuation signal of the probe. Experimental characterizations using square-modulated sine waves show that latency of 500 ns is achieved with a carrier frequency of 10 MHz, which is ten times faster compared with a state-of-the-art lock-in amplifier. A tracking bandwidth greater than 200 kHz is obtained experimentally. The method is eventually applied to a close-loop AFM scan realized using a 15-MHz AFM probe, showing its suitability for high-frequency oscillating probes.
AbstractList	One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demod-ulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being phase-locked on the probe actuation. The method is implemented on a RedPitaya platform, with its clock being generated from the actuation signal of the probe. Experimental characterizations using square-modulated sine waves show that latency of 500 ns is achieved with a carrier frequency of 10 MHz, which is ten times faster compared with a state-of-the-art lock-in amplifier. A tracking bandwidth greater than 200 kHz is obtained experimentally. The method is eventually applied to a close-loop AFM scan realized using a 15-MHz AFM probe, showing its suitability for high-frequency oscillating probes. Index Terms-Amplitude and phase demodulation, atomic force microscopy (AFM), field-programmable gate array (FPGA) implementation. One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we present the amplitude and phase estimation method based on the acquisition of four points per oscillation, with the sampling frequency being phase-locked on the probe actuation. The method is implemented on a RedPitaya platform, with its clock being generated from the actuation signal of the probe. Experimental characterizations using square-modulated sine waves show that latency of 500 ns is achieved with a carrier frequency of 10 MHz, which is ten times faster compared with a state-of-the-art lock-in amplifier. A tracking bandwidth greater than 200 kHz is obtained experimentally. The method is eventually applied to a close-loop AFM scan realized using a 15-MHz AFM probe, showing its suitability for high-frequency oscillating probes.
Author	Lagrange, Denis Legrand, Bernard Mauran, Nicolas Schwab, Lucien
Author_xml	– sequence: 1 givenname: Denis surname: Lagrange fullname: Lagrange, Denis email: denis.lagrange@laas.fr organization: Laboratoire d'Analyse et d'Architecture des Systèmes (LAAS), CNRS UPR 8001, Université de Toulouse, Toulouse, France – sequence: 2 givenname: Nicolas surname: Mauran fullname: Mauran, Nicolas email: nicolas.mauran@laas.fr organization: Laboratoire d'Analyse et d'Architecture des Systèmes (LAAS), CNRS UPR 8001, Université de Toulouse, Toulouse, France – sequence: 3 givenname: Lucien surname: Schwab fullname: Schwab, Lucien email: lucien.schwab@laas.fr organization: Laboratoire d'Analyse et d'Architecture des Systèmes (LAAS), CNRS UPR 8001, Université de Toulouse, Toulouse, France – sequence: 4 givenname: Bernard orcidid: 0000-0001-5158-3654 surname: Legrand fullname: Legrand, Bernard email: bernard.legrand@laas.fr organization: Laboratoire d'Analyse et d'Architecture des Systèmes (LAAS), CNRS UPR 8001, Université de Toulouse, Toulouse, France
BackLink	https://laas.hal.science/hal-02974151$$DView record in HAL
BookMark	eNp9kLFOwzAQhi1UJErhARBLJCaGFJ8dx_FYFUpBQSBRZst1beoqjYuTgvr2JE1hYGDyyff9p7vvFPVKXxqELgAPAbC4mY1fZ0OCCR5STDJO-RHqA2NZjLOU9ZoapzROGU1P0GlVrTCGhBHeR4-5_4pyVZtS76Jbs_aLbaFq58vI-hBN3fsyngTzsd33R7VfOx1NfNAmenI6-Er7zS56CX5uqjN0bFVRmfPDO0Bvk7vZeBrnz_cP41Eea8pxHTPNAMBkymYcLyDRQCEVhooktQlo0RSWmozheUIFT_WcKGsXSoHSnAmB6QBdd3OXqpCb4NYq7KRXTk5HuWz_MBE8AQaf0LBXHbsJvjmiquXKb0PZrCdJYycjVNCW4h3VXlQFY6V29d5CHZQrJGDZSpatZNlKlgfJTRL-JH8W-i9z2WWcMeaXF4QIQjP6DdArh84
CODEN	IETTE2
CitedBy_id	crossref_primary_10_3390_mi14112009 crossref_primary_10_3390_s24051631 crossref_primary_10_1016_j_measurement_2023_113731
Cites_doi	10.1073/pnas.211400898 10.1109/ACC.2011.5991144 10.1209/0295-5075/3/12/006 10.1039/C9NR09690F 10.1063/1.4865841 10.3182/20110828-6-IT-1002.00869 10.1126/science.1137591 10.1016/j.progsurf.2008.09.001 10.1063/1.4985125 10.1109/TCST.2017.2692721 10.1126/science.1176210 10.1109/JMEMS.2011.2179012 10.1002/9781118360668.ch1 10.1016/S0006-3495(94)80649-6 10.1063/1.347347 10.1109/TUFFC.2018.2883830 10.1063/1.1683462 10.1016/j.ultramic.2017.01.005 10.1109/TCST.2015.2435654 10.1103/PhysRevLett.56.930 10.1038/77936 10.1038/nature09450 10.3762/bjnano.8.142
ContentType	Journal Article
Copyright	Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021 Copyright
Copyright_xml	– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021 – notice: Copyright
DBID	97E RIA RIE AAYXX CITATION 7SP 7TB 8FD FR3 L7M 1XC VOOES
DOI	10.1109/TCST.2020.3028737
DatabaseName	IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Electronics & Communications Abstracts Mechanical & Transportation Engineering Abstracts Technology Research Database Engineering Research Database Advanced Technologies Database with Aerospace Hyper Article en Ligne (HAL) Hyper Article en Ligne (HAL) (Open Access)
DatabaseTitle	CrossRef Engineering Research Database Technology Research Database Mechanical & Transportation Engineering Abstracts Advanced Technologies Database with Aerospace Electronics & Communications Abstracts
DatabaseTitleList	Engineering Research Database
Database_xml	– sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher
DeliveryMethod	fulltext_linktorsrc
Discipline	Engineering
EISSN	1558-0865
EndPage	2270
ExternalDocumentID	oai:HAL:hal-02974151v1 10_1109_TCST_2020_3028737 9229238
Genre	orig-research
GrantInformation_xml	– fundername: French Délégation Générale de l’Armement (DGA) – fundername: French National Research Agency (ANR) through the research project OLYMPIA grantid: ANR-14-CE26-001
GroupedDBID	-~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACBEA ACGFO ACGFS ACIWK ACKIV AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RNS TN5 VH1 AAYXX CITATION 7SP 7TB 8FD FR3 L7M 1XC VOOES
ID	FETCH-LOGICAL-c370t-5c5111e8af870d14c13169e3946f41c9394f3e850b43976cb2affdaa1ac759903
IEDL.DBID	RIE
ISICitedReferencesCount	4
ISICitedReferencesURI	http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000682140300035&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN	1063-6536
IngestDate	Sat Oct 25 07:18:48 EDT 2025 Sun Nov 09 07:37:48 EST 2025 Sat Nov 29 03:51:41 EST 2025 Tue Nov 18 22:35:24 EST 2025 Wed Aug 27 02:25:25 EDT 2025
IsDoiOpenAccess	true
IsOpenAccess	true
IsPeerReviewed	true
IsScholarly	true
Issue	5
Keywords	low latency amplitude and phase demodulation field-programmable gate array (FPGA) implementations atomic force microscopy
Language	English
License	https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html Copyright: http://hal.archives-ouvertes.fr/licences/copyright
LinkModel	DirectLink
MergedId	FETCHMERGED-LOGICAL-c370t-5c5111e8af870d14c13169e3946f41c9394f3e850b43976cb2affdaa1ac759903
Notes	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14
ORCID	0000-0001-5158-3654
OpenAccessLink	https://laas.hal.science/hal-02974151
PQID	2558823931
PQPubID	85425
PageCount	7
ParticipantIDs	crossref_citationtrail_10_1109_TCST_2020_3028737 ieee_primary_9229238 crossref_primary_10_1109_TCST_2020_3028737 hal_primary_oai_HAL_hal_02974151v1 proquest_journals_2558823931
PublicationCentury	2000
PublicationDate	2021-Sept. 2021-9-00 20210901 2021-09
PublicationDateYYYYMMDD	2021-09-01
PublicationDate_xml	– month: 09 year: 2021 text: 2021-Sept.
PublicationDecade	2020
PublicationPlace	New York
PublicationPlace_xml	– name: New York
PublicationTitle	IEEE transactions on control systems technology
PublicationTitleAbbrev	TCST
PublicationYear	2021
Publisher	IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Publisher_xml	– name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) – name: Institute of Electrical and Electronics Engineers
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References_xml	– ident: ref28 doi: 10.1073/pnas.211400898 – ident: ref16 doi: 10.1109/ACC.2011.5991144 – ident: ref2 doi: 10.1209/0295-5075/3/12/006 – ident: ref21 doi: 10.1039/C9NR09690F – ident: ref12 doi: 10.1063/1.4865841 – ident: ref17 doi: 10.3182/20110828-6-IT-1002.00869 – ident: ref23 doi: 10.1126/science.1137591 – volume: 290 start-page: 688 year: 1993 ident: ref5 article-title: Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy publication-title: Surf Sci Lett – ident: ref8 doi: 10.1016/j.progsurf.2008.09.001 – ident: ref20 doi: 10.1063/1.4985125 – ident: ref15 doi: 10.1109/TCST.2017.2692721 – ident: ref22 doi: 10.1126/science.1176210 – ident: ref18 doi: 10.1109/JMEMS.2011.2179012 – ident: ref7 doi: 10.1002/9781118360668.ch1 – year: 2020 ident: ref27 publication-title: From the Specifications of Zurich Instruments Lock-in Amplifiers Products – year: 2020 ident: ref24 publication-title: RedPitatya STEMlab Board – ident: ref6 doi: 10.1016/S0006-3495(94)80649-6 – ident: ref4 doi: 10.1063/1.347347 – year: 2020 ident: ref26 publication-title: Vmicro Ring Probe Product – ident: ref25 doi: 10.1109/TUFFC.2018.2883830 – ident: ref11 doi: 10.1063/1.1683462 – ident: ref19 doi: 10.1016/j.ultramic.2017.01.005 – start-page: 1 year: 1986 ident: ref13 article-title: RMS-DC conversion-Theory publication-title: RMS To DC Conversion Application Guide – ident: ref14 doi: 10.1109/TCST.2015.2435654 – ident: ref1 doi: 10.1103/PhysRevLett.56.930 – ident: ref3 doi: 10.1038/77936 – ident: ref9 doi: 10.1038/nature09450 – ident: ref10 doi: 10.3762/bjnano.8.142
SSID	ssj0014527
Score	2.367142
Snippet	One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demodulation of the probe signal. In this contribution, we... One prerequisite for high-speed imaging in dynamic-mode atomic force microscopy (AFM) is the fast demod-ulation of the probe signal. In this contribution, we...
SourceID	hal proquest crossref ieee
SourceType	Open Access Repository Aggregation Database Enrichment Source Index Database Publisher
StartPage	2264
SubjectTerms	Actuation Amplitude and phase demodulation Atomic force microscopy atomic force microscopy (AFM) Bandwidth Carrier frequencies Demodulation Electronics Engineering Sciences Field programmable gate arrays field-programmable gate array~(FPGA) implementation Lock in amplifiers Micro and nanotechnologies Microelectronics Microscopes Microscopy Signal and Image processing Sine waves
Title	Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes
URI	https://ieeexplore.ieee.org/document/9229238 https://www.proquest.com/docview/2558823931 https://laas.hal.science/hal-02974151
Volume	29
WOSCitedRecordID	wos000682140300035&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText	1
inHoldings	1
isFullTextHit
isPrint
journalDatabaseRights	– providerCode: PRVIEE databaseName: IEEE Electronic Library (IEL) customDbUrl: eissn: 1558-0865 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014527 issn: 1063-6536 databaseCode: RIE dateStart: 19930101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE
link	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1dS-QwFL044sPug9-L9YsgPslmbZq0aR8HdRAZRXAWfCuZNGEFncrMqMy_9960FsFlYd9CSaD0NL3nNOfeC3DsM1VoLw3XWeq48nnMTTVWXFWZQ_2gfOxCEdehvrnJ7--L2yX42eXCOOeC-cz9omE4y69q-0K_yk6LJEE-kvegp7VucrW6EwPVtGdFhSN5Fo4ko7ae5uno7G6ESjBBgYrRVFPL808xqPeHHJChtcqX73EIMoO1_7u9dVhtySTrN-hvwJKbbML3TyUGt-BqWL-xoSFmvGDn7qmu2n5dDNkqI5cHH0wbO_WC9eeUo8wG9dQ6dk1WPUpaWbBbyhmabcPvwcXo7JK3_RO4lTqe89QimxIuNx43ZSWUFVJkhZOFyrwStsCBly5P43FgJXacGO8rY4SxOsUoJX_A8qSeuB1gWktrnK88bmBlx9J4pFlaGpMajYItjyD-eKKlbYuLU4-LxzKIjLgoCYSSQChbECI46ZY8N5U1_jX5CGHq5lFN7Mv-sKRr1H0LWYh4FRFsESjdrBaPCPY_UC3bDTorUUmhtpCFFLt_X7UH3xKyrwQ72T4sz6cv7gBW7Ov8YTY9DO_eO9d_1Gw
linkProvider	IEEE
linkToHtml	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3fa9RAEB7aKqgP9UctRqsu4pO4bTa7ySaPR-txanoUPKFvy95mFwV7kbtr5f57ZzZpKFSEvi1hF0K-bOb7st_MALwPhap0kJbrIvdchTLltpkrrprCo35QIfWxiGutp9Py_Lw624KPQy6M9z6az_whDeNZftO6S_pVdlRlGfKRchvu5UplosvWGs4MVNegFTWO5EU8lEz6ippHs-NvM9SCGUpUjKeamp7fiELbP8gDGZur3PoixzAzfny3G3wCuz2dZKMO_6ew5RfP4NGNIoN78KVu_7DaEjfesBN_0TZ9xy6GfJWRz4OPl52hesNGa8pSZuN26Tw7JbMepa1s2BllDa2ew_fxp9nxhPcdFLiTOl3z3CGfEr60AbdlI5QTUhSVl5UqghKuwkGQvszTeeQlbp7ZEBprhXU6xzgl92Fn0S78C2BaS2d9aAJuYeXm0gYkWlpam1uNkq1MIL1-osb15cWpy8UvE2VGWhkCwRAIpgchgQ_Dkt9dbY3_TX6HMA3zqCr2ZFQbukb9t5CHiCuRwB6BMszq8Ujg4BpV02_RlUEthepCVlK8_Peqt_BgMjutTf15-vUVPMzIzBLNZQews15e-tdw312tf66Wb-J7-BcOldez
openUrl	ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Low+Latency+Demodulation+for+High-Frequency+Atomic+Force+Microscopy+Probes&rft.jtitle=IEEE+transactions+on+control+systems+technology&rft.au=Lagrange%2C+Denis&rft.au=Mauran%2C+Nicolas&rft.au=Schwab%2C+Lucien&rft.au=Legrand%2C+Bernard&rft.date=2021-09-01&rft.pub=IEEE&rft.issn=1063-6536&rft.volume=29&rft.issue=5&rft.spage=2264&rft.epage=2270&rft_id=info:doi/10.1109%2FTCST.2020.3028737&rft.externalDocID=9229238
thumbnail_l	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1063-6536&client=summon
thumbnail_m	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1063-6536&client=summon
thumbnail_s	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1063-6536&client=summon