APA (7th ed.) Citation

Lagrange, D., Mauran, N., Schwab, L., & Legrand, B. (2021). Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes. IEEE transactions on control systems technology, 29(5), 2264-2270. https://doi.org/10.1109/TCST.2020.3028737

Chicago Style (17th ed.) Citation

Lagrange, Denis, Nicolas Mauran, Lucien Schwab, and Bernard Legrand. "Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes." IEEE Transactions on Control Systems Technology 29, no. 5 (2021): 2264-2270. https://doi.org/10.1109/TCST.2020.3028737.

MLA (9th ed.) Citation

Lagrange, Denis, et al. "Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes." IEEE Transactions on Control Systems Technology, vol. 29, no. 5, 2021, pp. 2264-2270, https://doi.org/10.1109/TCST.2020.3028737.