Lagrange, D., Mauran, N., Schwab, L., & Legrand, B. (2021). Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes. IEEE transactions on control systems technology, 29(5), 2264-2270. https://doi.org/10.1109/TCST.2020.3028737
Chicago-Zitierstil (17. Ausg.)Lagrange, Denis, Nicolas Mauran, Lucien Schwab, und Bernard Legrand. "Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes." IEEE Transactions on Control Systems Technology 29, no. 5 (2021): 2264-2270. https://doi.org/10.1109/TCST.2020.3028737.
MLA-Zitierstil (9. Ausg.)Lagrange, Denis, et al. "Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes." IEEE Transactions on Control Systems Technology, vol. 29, no. 5, 2021, pp. 2264-2270, https://doi.org/10.1109/TCST.2020.3028737.