Huang, H., Khan, L., & Zhou, S. (2020). Classified enhancement model for big data storage reliability based on Boolean satisfiability problem. Cluster computing, 23(2), 483-492. https://doi.org/10.1007/s10586-019-02941-1
Citace podle Chicago (17th ed.)Huang, Hong, Latifur Khan, a Shaohua Zhou. "Classified Enhancement Model for Big Data Storage Reliability Based on Boolean Satisfiability Problem." Cluster Computing 23, no. 2 (2020): 483-492. https://doi.org/10.1007/s10586-019-02941-1.
Citace podle MLA (9th ed.)Huang, Hong, et al. "Classified Enhancement Model for Big Data Storage Reliability Based on Boolean Satisfiability Problem." Cluster Computing, vol. 23, no. 2, 2020, pp. 483-492, https://doi.org/10.1007/s10586-019-02941-1.
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