APA (7th ed.) Citation

Ge, J., Qin, Q., Song, S., Jiang, J., & Shen, Z. (2024). Unsupervised selective labeling for semi-supervised industrial defect detection. Journal of King Saud University. Computer and information sciences, 36(8), 102179. https://doi.org/10.1016/j.jksuci.2024.102179

Chicago Style (17th ed.) Citation

Ge, Jian, Qin Qin, Shaojing Song, Jinhua Jiang, and Zhiwei Shen. "Unsupervised Selective Labeling for Semi-supervised Industrial Defect Detection." Journal of King Saud University. Computer and Information Sciences 36, no. 8 (2024): 102179. https://doi.org/10.1016/j.jksuci.2024.102179.

MLA (9th ed.) Citation

Ge, Jian, et al. "Unsupervised Selective Labeling for Semi-supervised Industrial Defect Detection." Journal of King Saud University. Computer and Information Sciences, vol. 36, no. 8, 2024, p. 102179, https://doi.org/10.1016/j.jksuci.2024.102179.