Some Challenges and Opportunities in Reliability Engineering

Today's fast-pace evolving and digitalizing World is posing new challenges to reliability engineering. On the other hand, the continuous advancement of technical knowledge and the increasing capabilities of monitoring and computing offer opportunities for new developments in reliability enginee...

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Vydané v:	IEEE transactions on reliability Ročník 65; číslo 4; s. 1769 - 1782
Hlavný autor:	Zio, Enrico
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	New York IEEE 01.12.2016 The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Predmet:	Accelerated degradation testing (ADT) Accelerated tests Data models Degradation degradation modeling dependent degradation Digitization distributed prognostics Electric shock Engineering Sciences Evolution evolving environment (EE) fleet prognostics Maintenance engineering Modelling multi-state system reliability physics-based models (PBMs) piecewise deterministic Markov process (PDMP) prognostic performance indicator (PPI) Prognostics and health management prognostics and health management (PHM) random shocks Reliability analysis Reliability engineering return of investment State-of-the-art reviews
ISSN:	0018-9529, 1558-1721
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Abstract	Today's fast-pace evolving and digitalizing World is posing new challenges to reliability engineering. On the other hand, the continuous advancement of technical knowledge and the increasing capabilities of monitoring and computing offer opportunities for new developments in reliability engineering. In this paper, I reflect on some of these challenges and opportunities in research and application. The underlying perspective taken stands on the following: The belief that the knowledge, information, and data (KID) available for the modeling, computations, and analyses done in reliability engineering is substantially grown and continue to do so; The belief that the technical capabilities for reliability engineering have been significantly advanced; The recognition of the increased complexity of the systems, nowadays more and more made of heterogeneous, highly interconnected elements. In line with this perspective, opportunities and challenges for reliability engineering are discussed in relation to degradation modeling and integration of multistate and physics-based models therein, accelerated degradation testing, component-, system- and fleet-wide prognostics and health management in evolving environments. The paper is not a review, nor a state of the art work, but rather it offers a vision of reflection on reliability engineering, for consideration and discussion by the interested scientific community. It does not pretend to give the unique view, nor to be complete in the subject discussed and the related literature referenced to.
AbstractList	Today's fast-pace evolving and digitalizing World is posing new challenges to reliability engineering. On the other hand, the continuous advancement of technical knowledge and the increasing capabilities of monitoring and computing offer opportunities for new developments in reliability engineering. In this paper, I reflect on some of these challenges and opportunities in research and application. The underlying perspective taken stands on:  the belief that the knowledge, information and data (KID) available for the modeling, computations and analyses done in reliability engineering is substantially grown and continue to do so;  the belief that the technical capabilities for reliability engineering have been significantly advanced;  the recognition of the increased complexity of the systems, nowadays more and more made of heterogeneous, highly interconnected elements.In line with this perspective, opportunities and challenges for reliability engineering are discussed in relation to degradation modeling and integration of multi-state and physics-based models therein, accelerated degradation testing, component-, system-and fleet-wide prognostics and health management in evolving environments. The paper is not a review, nor a state of the art work, but rather it offers a vision of reflection on reliability engineering, for consideration and discussion by the interested scientific community. It does not pretend to give the unique view, nor to be complete in the subject discussed and the related literature referenced to. Today's fast-pace evolving and digitalizing World is posing new challenges to reliability engineering. On the other hand, the continuous advancement of technical knowledge and the increasing capabilities of monitoring and computing offer opportunities for new developments in reliability engineering. In this paper, I reflect on some of these challenges and opportunities in research and application. The underlying perspective taken stands on the following: The belief that the knowledge, information, and data (KID) available for the modeling, computations, and analyses done in reliability engineering is substantially grown and continue to do so; The belief that the technical capabilities for reliability engineering have been significantly advanced; The recognition of the increased complexity of the systems, nowadays more and more made of heterogeneous, highly interconnected elements. In line with this perspective, opportunities and challenges for reliability engineering are discussed in relation to degradation modeling and integration of multistate and physics-based models therein, accelerated degradation testing, component-, system- and fleet-wide prognostics and health management in evolving environments. The paper is not a review, nor a state of the art work, but rather it offers a vision of reflection on reliability engineering, for consideration and discussion by the interested scientific community. It does not pretend to give the unique view, nor to be complete in the subject discussed and the related literature referenced to.
Author	Zio, Enrico
Author_xml	– sequence: 1 givenname: Enrico surname: Zio fullname: Zio, Enrico email: enrico.zio@centralesupelec.fr organization: Dept. of Syst. Sci. & the Energetic Challenge, Univ. Paris-Saclay, Châtenay-Malabry, France
BackLink	https://hal.science/hal-01550063$$DView record in HAL
BookMark	eNp1kM1Lw0AQxRepYK2ePXgJePKQdiebzQd4KaVaoVCo9bxsNpO6Jd3EzVbof--WVA-Ccxlm-L3hzbsmA9MYJOQO6BiA5pPNehxRSMYRz4HT-IIMgfMshDSCARlSClmY8yi_Itddt_NjHOfZkDy9NXsMZh-yrtFssQukKYNV2zbWHYx22m-0CdZYa1noWrtjMDdbbRCtNtsbclnJusPbcx-R9-f5ZrYIl6uX19l0GSqWxC7EgklVpIgKGCsL5KiSKGZZVmQFzfMqKZmSSVJxqEoaY0kVxJypmFGFKlWSjchjf9fbFK3Ve2mPopFaLKZLcdpR_yqlCfsCzz70bGubzwN2TuyagzXenoDMn4XEl6d4TynbdJ3FSijtpNONcVbqWgAVp1DFZi1OoYpzqF43-aP7sfO_4r5XaET8pVPOaB4B-wZAS4LW
CODEN	IERQAD
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ContentType	Journal Article
Copyright	Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016 Distributed under a Creative Commons Attribution 4.0 International License
Copyright_xml	– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016 – notice: Distributed under a Creative Commons Attribution 4.0 International License
DBID	97E RIA RIE AAYXX CITATION 7SP 8FD L7M 1XC VOOES
DOI	10.1109/TR.2016.2591504
DatabaseName	IEEE Xplore (IEEE) IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace Hyper Article en Ligne (HAL) Hyper Article en Ligne (HAL) (Open Access)
DatabaseTitle	CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts
DatabaseTitleList	Technology Research Database
Database_xml	– sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher
DeliveryMethod	fulltext_linktorsrc
Discipline	Engineering
EISSN	1558-1721
EndPage	1782
ExternalDocumentID	oai:HAL:hal-01550063v1 10_1109_TR_2016_2591504 7530921
Genre	orig-research
GroupedDBID	-~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 8WZ 97E A6W AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ OCL P2P RIA RIE RNS TN5 VH1 VJK AAYXX CITATION 7SP 8FD L7M 1XC VOOES
ID	FETCH-LOGICAL-c364t-eb3acb7eec133dbe5ec624388b8b099f6d3ca66f51fd04ed0c1453c430cec7ca3
IEDL.DBID	RIE
ISICitedReferencesCount	157
ISICitedReferencesURI	http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000391284600011&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN	0018-9529
IngestDate	Tue Oct 14 20:48:14 EDT 2025 Sun Nov 09 08:13:07 EST 2025 Sat Nov 29 01:54:33 EST 2025 Tue Nov 18 22:30:52 EST 2025 Tue Aug 26 16:41:47 EDT 2025
IsDoiOpenAccess	true
IsOpenAccess	true
IsPeerReviewed	true
IsScholarly	true
Issue	4
Language	English
License	https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html Distributed under a Creative Commons Attribution 4.0 International License: http://creativecommons.org/licenses/by/4.0
LinkModel	DirectLink
MergedId	FETCHMERGED-LOGICAL-c364t-eb3acb7eec133dbe5ec624388b8b099f6d3ca66f51fd04ed0c1453c430cec7ca3
Notes	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14
ORCID	0000-0002-7108-637X
OpenAccessLink	https://hal.science/hal-01550063
PQID	1845316666
PQPubID	85456
PageCount	14
ParticipantIDs	crossref_primary_10_1109_TR_2016_2591504 proquest_journals_1845316666 crossref_citationtrail_10_1109_TR_2016_2591504 hal_primary_oai_HAL_hal_01550063v1 ieee_primary_7530921
PublicationCentury	2000
PublicationDate	2016-12-01
PublicationDateYYYYMMDD	2016-12-01
PublicationDate_xml	– month: 12 year: 2016 text: 2016-12-01 day: 01
PublicationDecade	2010
PublicationPlace	New York
PublicationPlace_xml	– name: New York
PublicationTitle	IEEE transactions on reliability
PublicationTitleAbbrev	TR
PublicationYear	2016
Publisher	IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Publisher_xml	– name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) – name: Institute of Electrical and Electronics Engineers
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SSID	ssj0014498
Score	2.5620754
Snippet	Today's fast-pace evolving and digitalizing World is posing new challenges to reliability engineering. On the other hand, the continuous advancement of...
SourceID	hal proquest crossref ieee
SourceType	Open Access Repository Aggregation Database Enrichment Source Index Database Publisher
StartPage	1769
SubjectTerms	Accelerated degradation testing (ADT) Accelerated tests Data models Degradation degradation modeling dependent degradation Digitization distributed prognostics Electric shock Engineering Sciences Evolution evolving environment (EE) fleet prognostics Maintenance engineering Modelling multi-state system reliability physics-based models (PBMs) piecewise deterministic Markov process (PDMP) prognostic performance indicator (PPI) Prognostics and health management prognostics and health management (PHM) random shocks Reliability analysis Reliability engineering return of investment State-of-the-art reviews
Title	Some Challenges and Opportunities in Reliability Engineering
URI	https://ieeexplore.ieee.org/document/7530921 https://www.proquest.com/docview/1845316666 https://hal.science/hal-01550063
Volume	65
WOSCitedRecordID	wos000391284600011&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText	1
inHoldings	1
isFullTextHit
isPrint
journalDatabaseRights	– providerCode: PRVIEE databaseName: IEEE Electronic Library (IEL) customDbUrl: eissn: 1558-1721 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014498 issn: 0018-9529 databaseCode: RIE dateStart: 19630101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE
link	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB5q8aAHX1WsVgniwYNps80mmwUvpSg9lCpapbew2Z1gQdPSF_jv3d2kQVEP3kKYgWUmO_tNduYbgEuihCcMT2WIGr7RgCs3Yei5hBFDvq4QbTXhS58NBtFoxB8qcF32wiCiLT7Dpnm0d_lqIpfmV1lLQ2uPm67xDcZY3qtV3hhQyouoqzdw0OYFjQ_xeGv4aEq4wqZG-hr-0G8n0MarqX-0g1V-RGN7xNzt_m9xe7BTQEmnk_t-HyqYHcD2F4LBGtw8Td7R6a4HpswdkSnnfmow9zKzXKrOOHNMWXJO1_3hfFE_hOe722G35xbzElzph3Th6rxYSG1plDrxVAkGKMM29aMoiRINBNNQ-VKEYRqQVHkUlScJDXxJfU-iZFL4R1DNJhkegyMMciMcIyYSSgSNhEwlj9pEplQwgnVorm0Yy4JM3My0eIttUuHxePgYG6PHhdHrcFUqTHMejb9FL7RZSinDf93r9GPzziZUGlStSB1qxgWlVGH9OjTWPoyLzTiPdRKrI43O08KT37VOYcssIK9SaUB1MVviGWzK1WI8n53b7-wTJrzO5A
linkProvider	IEEE
linkToHtml	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8QwEB7WB6gH3-L6LOLBg12bbfoIeJFFWXFdZV3FW0iTKQralX2B_94k7ZYV9eCtlBkIM83km2bmG4BjooQnDE9liBq-0YApN4nQc0lEDPm6QrTVhE-tqN2On5_ZfQVOy14YRLTFZ1gzj_YuX_XkyPwqO9PQ2mOma3wuoLRO8m6t8s6AUlbEXb2FgzoriHyIx866HVPEFdY01tcAiH47g2ZeTAWkHa3yIx7bQ-Zq5X_LW4XlAkw6F7n316CC2TosTVEMbsD5Q-8dncZkZMrAEZly7j4M6h5llk3Vec0cU5icE3Z_OlPqm_B4ddltNN1iYoIr_ZAOXZ0ZC6ltjVKnnirBAGVYp34cJ3GioWAaKl-KMEwDkiqPovIkoYEvqe9JlJEU_hbMZr0Mt8ERBrsRhnEkEkoEjYVMJYvrRKZURASrUJvYkMuCTtxMtXjjNq3wGO92uDE6L4xehZNS4SNn0vhb9EibpZQyDNjNixY372xKpWHVmFRhw7iglCqsX4W9iQ95sR0HXKexOtboTC3c-V3rEBaa3dsWb123b3Zh0Swmr1nZg9lhf4T7MC_Hw9dB_8B-c18TTdIr
openUrl	ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Some+Challenges+and+Opportunities+in+Reliability+Engineering&rft.jtitle=IEEE+transactions+on+reliability&rft.au=Zio%2C+Enrico&rft.date=2016-12-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=0018-9529&rft.eissn=1558-1721&rft.volume=65&rft.issue=4&rft.spage=1769&rft_id=info:doi/10.1109%2FTR.2016.2591504&rft.externalDBID=NO_FULL_TEXT
thumbnail_l	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9529&client=summon
thumbnail_m	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9529&client=summon
thumbnail_s	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9529&client=summon