Modeling and Simulating Multiple Failure Masking Enabled by Local Recovery for Stencil-Based Applications at Extreme Scales

Obtaining multi-process hard failure resilience at the application level is a key challenge that must be overcome before the promise of exascale can be fully realized. Previous work has shown that online global recovery can dramatically reduce the overhead of failures when compared to the more tradi...

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Vydáno v:	IEEE transactions on parallel and distributed systems Ročník 28; číslo 10; s. 2881 - 2895
Hlavní autoři:	Gamell, Marc, Teranishi, Keita, Mayo, Jackson, Kolla, Hemanth, Heroux, Michael A., Chen, Jacqueline, Parashar, Manish
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York IEEE 01.10.2017 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:	Computational modeling Computer simulation Delays Failure Failure analysis failure masking Failure rates Fault tolerance Fault tolerant systems Hardware Masking MATHEMATICS AND COMPUTING modeling Parallel processing Protocols Recovery Resilience Restarting stencil computation
ISSN:	1045-9219, 1558-2183
On-line přístup:	Získat plný text
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