Modeling and Simulating Multiple Failure Masking Enabled by Local Recovery for Stencil-Based Applications at Extreme Scales
Obtaining multi-process hard failure resilience at the application level is a key challenge that must be overcome before the promise of exascale can be fully realized. Previous work has shown that online global recovery can dramatically reduce the overhead of failures when compared to the more tradi...
Saved in:
| Published in: | IEEE transactions on parallel and distributed systems Vol. 28; no. 10; pp. 2881 - 2895 |
|---|---|
| Main Authors: | , , , , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
New York
IEEE
01.10.2017
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects: | |
| ISSN: | 1045-9219, 1558-2183 |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Abstract | Obtaining multi-process hard failure resilience at the application level is a key challenge that must be overcome before the promise of exascale can be fully realized. Previous work has shown that online global recovery can dramatically reduce the overhead of failures when compared to the more traditional approach of terminating the job and restarting it from the last stored checkpoint. If online recovery is performed in a local manner further scalability is enabled, not only due to the intrinsic lower costs of recovering locally, but also due to derived effects when using some application types. In this paper we model one such effect, namely multiple failure masking, that manifests when running Stencil parallel computations on an environment when failures are recovered locally. First, the delay propagation shape of one or multiple failures recovered locally is modeled to enable several analyses of the probability of different levels of failure masking under certain Stencil application behaviors. Our results indicate that failure masking is an extremely desirable effect at scale which manifestation is more evident and beneficial as the machine size or the failure rate increase. |
|---|---|
| AbstractList | Obtaining multi-process hard failure resilience at the application level is a key challenge that must be overcome before the promise of exascale can be fully realized. Previous work has shown that online global recovery can dramatically reduce the overhead of failures when compared to the more traditional approach of terminating the job and restarting it from the last stored checkpoint. If online recovery is performed in a local manner further scalability is enabled, not only due to the intrinsic lower costs of recovering locally, but also due to derived effects when using some application types. In this paper we model one such effect, namely multiple failure masking, that manifests when running Stencil parallel computations on an environment when failures are recovered locally. First, the delay propagation shape of one or multiple failures recovered locally is modeled to enable several analyses of the probability of different levels of failure masking under certain Stencil application behaviors. Our results indicate that failure masking is an extremely desirable effect at scale which manifestation is more evident and beneficial as the machine size or the failure rate increase. By obtaining multi-process hard failure resilience at the application level is a key challenge that must be overcome before the promise of exascale can be fully realized. Some previous work has shown that online global recovery can dramatically reduce the overhead of failures when compared to the more traditional approach of terminating the job and restarting it from the last stored checkpoint. If online recovery is performed in a local manner further scalability is enabled, not only due to the intrinsic lower costs of recovering locally, but also due to derived effects when using some application types. In this paper we model one such effect, namely multiple failure masking, that manifests when running Stencil parallel computations on an environment when failures are recovered locally. First, the delay propagation shape of one or multiple failures recovered locally is modeled to enable several analyses of the probability of different levels of failure masking under certain Stencil application behaviors. These results indicate that failure masking is an extremely desirable effect at scale which manifestation is more evident and beneficial as the machine size or the failure rate increase. |
| Author | Heroux, Michael A. Parashar, Manish Teranishi, Keita Gamell, Marc Chen, Jacqueline Kolla, Hemanth Mayo, Jackson |
| Author_xml | – sequence: 1 givenname: Marc surname: Gamell fullname: Gamell, Marc email: mgamell@cac.rutgers.edu organization: Rutgers Discovery Inf. Inst., Rutgers Univ., Piscataway, NJ, USA – sequence: 2 givenname: Keita surname: Teranishi fullname: Teranishi, Keita email: knteran@sandia.gov organization: Sandia Nat. Labs., Livermore, CA, USA – sequence: 3 givenname: Jackson surname: Mayo fullname: Mayo, Jackson email: jmayo@sandia.gov organization: Sandia Nat. Labs., Livermore, CA, USA – sequence: 4 givenname: Hemanth surname: Kolla fullname: Kolla, Hemanth email: hnkolla@sandia.gov organization: Sandia Nat. Labs., Livermore, CA, USA – sequence: 5 givenname: Michael A. surname: Heroux fullname: Heroux, Michael A. email: maherou@sandia.gov organization: Sandia Nat. Labs., Albuquerque, NM, USA – sequence: 6 givenname: Jacqueline surname: Chen fullname: Chen, Jacqueline email: jhchen@sandia.gov organization: Sandia Nat. Labs., Livermore, CA, USA – sequence: 7 givenname: Manish surname: Parashar fullname: Parashar, Manish email: parashar@cac.rutgers.edu organization: Rutgers Discovery Inf. Inst., Rutgers Univ., Piscataway, NJ, USA |
| BackLink | https://www.osti.gov/servlets/purl/1356841$$D View this record in Osti.gov |
| BookMark | eNp9kc9vFCEUxyemJvaHf4DxQvQ8KwwMDMfabtVkNzZuPROGeaNUFkZgjBv_-TJu46EHT0D4fN57ed-z6sQHD1X1iuAVIVi-u7u93q0aTMSq4ZK3tHtWnZK27eqGdPSk3DFra9kQ-aI6S-keY8JazE6rP9swgLP-G9J-QDu7n53Oy3M7u2wnB-hGWzdHQFudfiwfa697BwPqD2gTjHboC5jwC-IBjSGiXQZvrKvf61SYy2ly1pSCwSekM1r_zhH2gHbFg3RRPR-1S_Dy8Tyvvt6s764-1pvPHz5dXW5qQznNNTeUSSwNdANv2mYA0WlgACNAy3oOTDRyZGzsseE9xdj0DSViGHoBg-nbkZ5Xb451Q8pWJWMzmO8meA8mK0Jb3jFSoLdHaIrh5wwpq_swR1_mUg0RjHFJRVcocqRMDClFGNUU7V7HgyJYLUGoJQi1BKEegyiOeOKUCf7uJMey2_-ar4-mBYB_nYTEneSCPgCV1plo |
| CODEN | ITDSEO |
| CitedBy_id | crossref_primary_10_1109_TPDS_2021_3082802 crossref_primary_10_1177_10943420241265936 crossref_primary_10_1177_1094342021990433 crossref_primary_10_1016_j_future_2020_01_026 crossref_primary_10_1016_j_future_2018_09_041 crossref_primary_10_1016_j_future_2022_12_001 |
| Cites_doi | 10.1109/SC.2012.77 10.1109/ICPP.2012.45 10.1145/214451.214456 10.1088/1749-4699/2/1/015001 10.1109/IPDPS.2007.370605 10.1145/2503210.2503271 10.1145/2465813.2465814 10.1145/2807591.2807672 10.1145/62546.62575 10.1137/070693199 10.1145/2063384.2063427 10.1016/0743-7315(88)90027-5 10.1109/ExaMPI.2014.6 10.1109/CLUSTR.2003.1253321 10.1109/DSN.2015.52 10.1109/12.142678 10.1109/TC.2003.1197125 10.1145/2493123.2462908 10.1088/1742-6596/46/1/067 10.1145/2145816.2145845 10.1109/CLUSTER.2014.6968739 10.1177/1094342006067469 10.1109/IPDPS.2011.95 10.1177/1094342010391989 10.1109/TC.1984.1676475 10.1109/CLUSTR.2009.5289157 10.1109/SC.2010.18 10.1109/DSN.2014.101 10.1145/1551609.1551619 10.1109/SNAPI.2010.10 10.1145/568522.568525 10.1109/DSNW.2012.6264677 10.2172/1081941 10.1109/ICPP.2011.85 10.1109/IPDPS.2013.69 10.1007/978-3-540-75416-9_22 10.2172/1078029 10.1145/2807591.2807665 |
| ContentType | Journal Article |
| Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017 |
| Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017 |
| CorporateAuthor | Sandia National Lab. (SNL-NM), Albuquerque, NM (United States) |
| CorporateAuthor_xml | – name: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States) |
| DBID | 97E RIA RIE AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D OIOZB OTOTI |
| DOI | 10.1109/TPDS.2017.2696538 |
| DatabaseName | IEEE Xplore (IEEE) IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Xplore CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional OSTI.GOV - Hybrid OSTI.GOV |
| DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional |
| DatabaseTitleList | Technology Research Database |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Xplore url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Computer Science |
| EISSN | 1558-2183 |
| EndPage | 2895 |
| ExternalDocumentID | 1356841 10_1109_TPDS_2017_2696538 7908967 |
| Genre | orig-research |
| GrantInformation_xml | – fundername: Office of Advanced Scientific Computing Research – fundername: EPSI grantid: DE-FG02-06ER54857 – fundername: Rutgers Discovery Informatics Institute – fundername: Honeywell International – fundername: ExaCT Combustion Co-Design Center grantid: 4000110839 – fundername: Analysis and Visualization (SDAV) grantid: DE-SC0007455 – fundername: National Nuclear Security Administration grantid: DE-NA0003525 funderid: 10.13039/100006168 – fundername: Office of Science funderid: 10.13039/100006132 – fundername: National Technology and Engineering Solutions of Sandia – fundername: U.S. Department of Energy’s funderid: 10.13039/100000015 |
| GroupedDBID | --Z -~X .DC 0R~ 29I 4.4 5GY 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACIWK AENEX AGQYO AHBIQ AKJIK AKQYR ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ IEDLZ IFIPE IPLJI JAVBF LAI M43 MS~ O9- OCL P2P PQQKQ RIA RIE RNS TN5 TWZ UHB AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D ABPTK OIOZB OTOTI PQEST RIC RIG |
| ID | FETCH-LOGICAL-c363t-6c34909ce8d6252de78ae4eefee54b6e4729f44fb0c6b300cb2317ddb7edcb5f3 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 8 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000410653500013&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 1045-9219 |
| IngestDate | Fri May 19 00:47:11 EDT 2023 Sun Nov 30 04:22:48 EST 2025 Sat Nov 29 03:36:10 EST 2025 Tue Nov 18 22:31:03 EST 2025 Wed Aug 27 02:52:20 EDT 2025 |
| IsDoiOpenAccess | false |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 10 |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html https://doi.org/10.15223/policy-029 https://doi.org/10.15223/policy-037 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c363t-6c34909ce8d6252de78ae4eefee54b6e4729f44fb0c6b300cb2317ddb7edcb5f3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21) National Science Foundation (NSF) SAND-2017-4099J USDOE National Nuclear Security Administration (NNSA) AC04-94AL85000; FG02-06ER54857; SC0007455 |
| ORCID | 0000000288515660 |
| OpenAccessLink | https://www.osti.gov/servlets/purl/1356841 |
| PQID | 2174469378 |
| PQPubID | 85437 |
| PageCount | 15 |
| ParticipantIDs | proquest_journals_2174469378 crossref_primary_10_1109_TPDS_2017_2696538 ieee_primary_7908967 osti_scitechconnect_1356841 crossref_citationtrail_10_1109_TPDS_2017_2696538 |
| PublicationCentury | 2000 |
| PublicationDate | 2017-10-01 |
| PublicationDateYYYYMMDD | 2017-10-01 |
| PublicationDate_xml | – month: 10 year: 2017 text: 2017-10-01 day: 01 |
| PublicationDecade | 2010 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York – name: United States |
| PublicationTitle | IEEE transactions on parallel and distributed systems |
| PublicationTitleAbbrev | TPDS |
| PublicationYear | 2017 |
| Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| References | ref35 ref13 ref34 ref37 ref15 ref36 gamell (ref12) 2015 ref14 ref31 ref30 ref33 ref11 ref32 ref10 hursey (ref16) 2010 ref1 ref39 ref17 ref38 coti (ref21) 2006 ref19 ref18 zheng (ref26) 2004 beckman (ref6) 2012 ref46 ref24 ref23 ref47 ref25 ref20 ref42 ref41 teranishi (ref40) 2014 ref22 ref44 katz (ref5) 2009 ref43 ref28 ref27 ref29 ref8 ref7 ref9 ref3 gamell (ref4) 2014 hoefler (ref45) 2007 amarasinghe (ref2) 2009 |
| References_xml | – ident: ref34 doi: 10.1109/SC.2012.77 – ident: ref32 doi: 10.1109/ICPP.2012.45 – ident: ref20 doi: 10.1145/214451.214456 – ident: ref44 doi: 10.1088/1749-4699/2/1/015001 – ident: ref14 doi: 10.1109/IPDPS.2007.370605 – ident: ref23 doi: 10.1145/2503210.2503271 – ident: ref10 doi: 10.1145/2465813.2465814 – ident: ref11 doi: 10.1145/2807591.2807672 – year: 2009 ident: ref2 article-title: ExaScale software study: Software challenges in extreme scale systems – ident: ref35 doi: 10.1145/62546.62575 – ident: ref38 doi: 10.1137/070693199 – ident: ref30 doi: 10.1145/2063384.2063427 – ident: ref42 doi: 10.1016/0743-7315(88)90027-5 – ident: ref39 doi: 10.1109/ExaMPI.2014.6 – ident: ref19 doi: 10.1109/CLUSTR.2003.1253321 – ident: ref47 doi: 10.1109/DSN.2015.52 – ident: ref36 doi: 10.1109/12.142678 – ident: ref13 doi: 10.1109/TC.2003.1197125 – year: 2010 ident: ref16 article-title: Coordinated checkpoint/restart process fault tolerance for MPI applications on HPC systems – year: 2012 ident: ref6 article-title: Exascale operating systems and runtime software report publication-title: Tech Rep – start-page: 93 year: 2004 ident: ref26 article-title: FTC-Charm++: An in-memory checkpoint-based fault tolerant runtime for Charm++ and MPI publication-title: Proc IEEE Int Conf Cluster Comput – ident: ref25 doi: 10.1145/2493123.2462908 – ident: ref17 doi: 10.1088/1742-6596/46/1/067 – ident: ref43 doi: 10.1145/2145816.2145845 – ident: ref37 doi: 10.1109/CLUSTER.2014.6968739 – ident: ref8 doi: 10.1177/1094342006067469 – ident: ref24 doi: 10.1109/IPDPS.2011.95 – ident: ref1 doi: 10.1177/1094342010391989 – ident: ref41 doi: 10.1109/TC.1984.1676475 – ident: ref22 doi: 10.1109/CLUSTR.2009.5289157 – year: 2009 ident: ref5 article-title: Fault tolerance for extreme-scale computing workshop, albuquerque, NM - march 19-20, 2009 publication-title: Tech Rep – ident: ref31 doi: 10.1109/SC.2010.18 – start-page: 279 year: 2015 ident: ref12 article-title: Exploring failure recovery for stencil-based applications at extreme scales publication-title: Proc Int Symp High-Perform Parallel Distrib Comput – start-page: 51:51 year: 2014 ident: ref40 article-title: Toward local failure local recovery resilience model using MPI-ULFM publication-title: Proceedings of the 21st European MPI Users' Group Meeting – ident: ref3 doi: 10.1109/DSN.2014.101 – ident: ref15 doi: 10.1145/1551609.1551619 – start-page: 895 year: 2014 ident: ref4 article-title: Exploring automatic, online failure recovery for scientific applications at extreme scales publication-title: Proc Int Conf High Perform Comput Netw Storage Anal – ident: ref29 doi: 10.1109/SNAPI.2010.10 – ident: ref18 doi: 10.1145/568522.568525 – ident: ref27 doi: 10.1109/DSNW.2012.6264677 – ident: ref9 doi: 10.2172/1081941 – ident: ref33 doi: 10.1109/ICPP.2011.85 – ident: ref28 doi: 10.1109/IPDPS.2013.69 – start-page: 125 year: 2007 ident: ref45 article-title: A Case for Standard Non-Blocking Collective Operations publication-title: Recent Advances in Parallel Virtual Machine and Message Passing Interface doi: 10.1007/978-3-540-75416-9_22 – ident: ref7 doi: 10.2172/1078029 – start-page: 18 year: 2006 ident: ref21 article-title: Blocking versus non-blocking coordinated checkpointing for large-scale fault tolerant MPI publication-title: Proc Int Conf High Perform Comput Netw Storage Anal – ident: ref46 doi: 10.1145/2807591.2807665 |
| SSID | ssj0014504 |
| Score | 2.298248 |
| Snippet | Obtaining multi-process hard failure resilience at the application level is a key challenge that must be overcome before the promise of exascale can be fully... By obtaining multi-process hard failure resilience at the application level is a key challenge that must be overcome before the promise of exascale can be... |
| SourceID | osti proquest crossref ieee |
| SourceType | Open Access Repository Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 2881 |
| SubjectTerms | Computational modeling Computer simulation Delays Failure Failure analysis failure masking Failure rates Fault tolerance Fault tolerant systems Hardware Masking MATHEMATICS AND COMPUTING modeling Parallel processing Protocols Recovery Resilience Restarting stencil computation |
| Title | Modeling and Simulating Multiple Failure Masking Enabled by Local Recovery for Stencil-Based Applications at Extreme Scales |
| URI | https://ieeexplore.ieee.org/document/7908967 https://www.proquest.com/docview/2174469378 https://www.osti.gov/servlets/purl/1356841 |
| Volume | 28 |
| WOSCitedRecordID | wos000410653500013&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE Xplore customDbUrl: eissn: 1558-2183 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014504 issn: 1045-9219 databaseCode: RIE dateStart: 19900101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NaxsxEB2S0EN7aNKkJW7SokNPpUpkSyutjmlr00MTAk4hN7EaacGQ2CHelIb--Wq0sjG0FHLaXdgveDs7bzQfD-ADetPqRGN5G-vIVbCCexkFRyUxiKbxyvZiE-bior6-tpdb8GndCxNjzMVn8YR2cy4_LPCBlspODSWptNmGbWN036u1zhioKksFpuii4jaZYclgDoU9vbr8OqUiLnMy0lZX1Iqy4YOyqEraLJJJ_fVDzl5msvu099uDl4VNsrMe_lewFef7sLtSamDFcPfhxcbYwQP4TQJo1IbOmnlg09ltlvBKh-elupBNmhmVq7PzZklL6WycO6wC84_sOzk_RlFrMoJHljgvmxLvnt3wz8kjBna2kRJnTcfGvzpag0wvk3zR8jX8mIyvvnzjRYSBo9Sy4xqlssJirEMKlUYhmrqJKsY2xkp5HVVi561SrReovRQCfWKMJtDU5oC-auUb2Jkv5vEQWLAqaIkmKCWV98KLxD3NqJEBK9UiDkCsYHFYJpSTUMaNy5GKsI6QdISkK0gO4OP6krt-PMf_Tj4gzNYnFrgGcETYu0Q5aG4uUoERdm4oK12r4QCOV5-EK-a9dBTHKZ2YXf323_c8guf05L7q7xh2uvuH-A6e4c9utrx_n7_cPwCj7XU |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3daxNBEB9qFbQPVttKY6vug0_itZvs3O7tY60JFZNQSIS-LbcfB4GaSHMtLf7z7txtQkAp-HR3sHcszMzNb3Y-fgAfnVWVjDA2q0IRMvSaZ1YEnjkUzvOytKhbsgk1HhdXV_pyCz6ve2FCCE3xWTih2yaX7xfulo7KThUlqaR6Ak9zxB5vu7XWOQPMG7LAGF_kmY6GmHKYXa5Pp5dfJ1TGpU56UsucmlE2vFBDqxIvi2hUf_2SGz8z2P2_Hb6ClwlPsrNWAV7DVpjvwe6Kq4El092DnY3Bg_vwmyjQqBGdlXPPJrOfDYlXfByl-kI2KGdUsM5G5ZIO01m_6bHyzD6wIbk_RnFrNIMHFlEvmxDynl1nX6JP9OxsIynOypr172s6hYybid5oeQA_Bv3p-UWWaBgyJ6SoM-kEaq5dKHwMlno-qKIMGEIVQo5WBoz4vEKsLHfSCs6djZhReZrb7J3NK_EGtueLeTgE5jV6KZzyiAKt5ZZH9Kl6pfAux8q5DvCVWIxLM8qJKuPaNLEK14YkaUiSJkmyA5_Wr_xqB3Q8tnifZLZemMTVgSOSvYmggybnOioxcrXpilwW2O3A8UolTDLwpaFIDmXEdsXbf3_zAzy_mI6GZvht_P0IXtAu2hrAY9iub27DO3jm7urZ8uZ9o8V_AHvx8Lw |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Modeling+and+Simulating+Multiple+Failure+Masking+Enabled+by+Local+Recovery+for+Stencil-Based+Applications+at+Extreme+Scales&rft.jtitle=IEEE+transactions+on+parallel+and+distributed+systems&rft.au=Gamell%2C+Marc&rft.au=Teranishi%2C+Keita&rft.au=Mayo%2C+Jackson&rft.au=Kolla%2C+Hemanth&rft.date=2017-10-01&rft.issn=1045-9219&rft.volume=28&rft.issue=10&rft.spage=2881&rft.epage=2895&rft_id=info:doi/10.1109%2FTPDS.2017.2696538&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TPDS_2017_2696538 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1045-9219&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1045-9219&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1045-9219&client=summon |