APA (7th ed.) Citation

Wang, K., Yuan, X., Chen, J., & Wang, Y. (2021). Supervised and semi-supervised probabilistic learning with deep neural networks for concurrent process-quality monitoring. Neural networks, 136, 54-62. https://doi.org/10.1016/j.neunet.2020.11.006

Chicago Style (17th ed.) Citation

Wang, Kai, Xiaofeng Yuan, Junghui Chen, and Yalin Wang. "Supervised and Semi-supervised Probabilistic Learning with Deep Neural Networks for Concurrent Process-quality Monitoring." Neural Networks 136 (2021): 54-62. https://doi.org/10.1016/j.neunet.2020.11.006.

MLA (9th ed.) Citation

Wang, Kai, et al. "Supervised and Semi-supervised Probabilistic Learning with Deep Neural Networks for Concurrent Process-quality Monitoring." Neural Networks, vol. 136, 2021, pp. 54-62, https://doi.org/10.1016/j.neunet.2020.11.006.